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IXRF's current products include
- Complete new EDS/EDX Systems - IXRF provides complete EDS systems and detectors.
- EDS System Upgrades - Using an existing EDS detector, older EDS systems can be upgraded to the latest software available on "new" systems for a much lower cost.
- fX SEM Tube - Provides a 500 micron to 5mm X-ray spot (XRF) analysis in the SEM.
- X-Beam - State-of-the-Art Micro XRF. Spot Sizes around 40-60 microns or larger.
- Detectors - LN2 SiLi detectors or cutting edge Silicon Drift Detectors (SDD). Resolutions down to 123eV resolution and up to 60mm2 active area.
- µPIEZO-SS Stages - Sub-stage for microanalysis and tabletop XRF analysis applications. High-speed; no backlash.
- Custom X-ray Applications - IXRF develops specialty products for a variety of customers. Customized Analytical software, Stage Automation, and product development.
Advantages
- High-Performance Features, offered as a Standard
- Fast Ethernet Electronics Design
- Excellent Service and Support
- Free Software Upgrades
Product History
- 2010: Major new version of application software released, Iridium Ultra, which is Windows 7-compliant
- 2009: High speed piezo stage for any SEM chamber "Super Stage", allows very fast XRF stage scans for mapping
- 2008: IXRF software is Vista-compliant, X-ray map transparency capability, ability to quantify EDS spectra from variable
pressure SEM
- 2007: Release of the 550i converts the IXRF interface electronics to Ethernet and can be used on any PC on the
SEM/STEM/TEM, eliminating the need for a second computer
- 2006: XRF successfully combines EDS and XRF into a single Quantitative Routine, adds RoboStage, Image Stitching,
X-ray Map Stitching
- 2005: X-Beam produces XRF 10-40 micron X-ray maps and is configured for automated particle analysis
- 2004: IXRF releases first ever combined EDS/XRF quantitative analysis
- 2003: IXRF completes Third fully integrated EDS system for TESCAN Digital Microscopy
- 2002: IXRF mounts the first XRF tube on a SEM, making the first fully-integrated XRF & EDS microanalysis within the SEM
- 2001: IXRF completes Particle Analysis on the Integrated JEOL Ltd product line
- 2000: IXRF completes the Second fully integrated EDS system, this time for JEOL Ltd product line
- 1999: IXRF designs a new hardware interface allowing the use of Oxford PentaFET detectors for upgrading existing EDS
customers
- 1999: IXRF completes “Particle Scan” offering the first truly integrated Particle Analysis within the operating system of the
SEM (developed for LEO Electron Microscopy)
- 1998: Jetscan Engine Health Monitor wins a millennium award from the British government (developed for LEO Electron
Microscopy)
- 1997: IXRF completes the First 100% Integrated EDS Microanalysis system in history (developed for LEO Electron
Microscopy)
- 1995: Digital Imaging, Feature Analysis, and X-Ray Mapping are added to the standard software
- 1993: Los Alamos National Lab receives the first IXRF system
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