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Evaluation IXRF vs. Other EDS/EDX

In order to make the most informed decision on a microanalysis (EDS/EDX) purchase, one should evaluate the market offerings. At IXRF we are confident our microanalysis offerings demonstrate value, innovation, price, and service superiority.  Don't believe us? Make the comparison yourself!  Below is a list of our offerings. ALL OPTIONS ARE INCLUDED AS STANDARD. Packages come with FREE SOFTWARE UPRGRADES FOR LIFE; never pay for another piece of software again, period!

We've also included a list of the current market competitors to assist your comparison. 

Contact IXRF Systems to schedule a live demonstration of our Science in SoftwareTM and discuss how we create value and continue to innovate for each of our customers! 1-281-286-6485.

IXRF vs. OTHER EDX VENDOR SPECIFICATIONS EVALUATION

(OTHER EDX VENDORS:  EDAX, OXFORD, BRUKER, THERMO)

 

EDS systems for SEMs (SDD Detectors and Software)

IridUltra+ PREMIUM

SDD detectors Part Number Resolution (eV) Range Active Area (mm2) Feature
SDD 3810 3810 138 B-Pu 10 Y
SDD 3510 3510 135 Be-Pu 10 Y
SDD 3310 3310 133 Be-Pu 10 Y
SDD 2810 2810 128 Be-Pu 10 Y
SDD 2610 2610 126 Be-Pu 10 Y
SDD 3330 3330 133 Be-Pu 30 Y
SDD 3360 3360 133 Be-Pu 60 Y

 

Iridium UltraTM Software Options

SPECTRA
IU-CALIBRATE Custom Sample Calibration Inc.
IU-AUTOACQUIRE AutoAcquire (kV, ID, Quant) Inc.
IU-GAUSS Gaussian Deconvolution Separation Inc.
IU-ANNOT Spectrum Annotations Inc.
IU-CHART Interactive Periodic Chart (Custom/Scrolling Markers) Inc.
IU-DIRECT SPECTRA Direct Acquire Spectra Inc.
IU-EXPORT File Export Inc.
IU-SPECTRA Drag and Drop Spectra Overlay Inc.
IU-REPORT InstaFLOW (Custom Word Reporting; Flow EDS Data) Inc.
IU-MATCH Spectrum Matching Inc.
IU-SYNTH Spectrum Synthesis Inc.
IU-VPQUANT Variable Pressure Quant Inc.
IU-ZAF Quantitative ZAF Inc.
IMAGING
IU-ACQUIRE Image Acquisition Inc.
IU-TOOL Analysis Suite (Toolbar) Inc.
IU-HISTO Histogram Equalization Inc.
IU-FILTER Kernel Filter (Custom Filters) Inc.
IU-MORPH Morphology Inc.
IU-SEGMENT Segmentation Inc.
IU-STITCH Stitching/Montage Inc.
MAPPING
IU-QUANTMAP Multielement Quantitative Mapping Inc.
IU-MAPOVERLAY Overlay Maps Inc.
IU-MAPTOOL Map Analysis Suite (Toolbar) Inc.
IU-EXTRACTSPECTRA Extract Spectra (Freehand, Spot, Area) Inc.
IU-LINESCAN Extract Linescan Inc.
IU-DATAVIEW DataView (Intensity/Concentration) Inc.
IU-DRIFT Beam drift correction (Requires SEM control) Inc.
IU-MPS Maximum Pixel Spectrum Inc.
IU-MONTAGE Map stitch & montage (Requires SEM control) Inc.
IU-SEM CONTROL Automate Stage and Beam automation (SEM control) Inc.
IU-PHASE Composition Mapping (Phase Analysis) Inc.
LINESCAN
IU-LINE Multielement Linescan Acquisition Inc.
IU-LINEOVERLAY Linescan Overlay Inc.
IU-DATAVIEW DataView (Intensity/Concentration) Inc.
IU-MULTI MultiScan inc
OTHER (Specialty)
IU-ROBO Full Stage Automation Inc.
IU-PARTICLE Iridum Feature Particle Analysis/GSR Inc

Warranty

Computer/Analyzer 3 years
SDD Detector 1 year
Extended Warranty Contract (COMPUTER/ANALYZER/DETECTOR w/contract) 3 years

 

 
Tired of Paying for Costly "Options"?

 PREMIUM IXRF SOFTWARE SPECIFICATIONS OFFERED AS STANDARD!

 (OTHER EDX VENDORS EITHER DO NOT OFFER OR INCLUDE AS COSTLY “OPTIONS”)

Direct Acquire

Iridium Ultra—Direct AcquireTM tools introduce unprecedented precision to microanalysis data collection.  This feature offers users unfettered access to all aspects of x-ray analysis directly from the SEM image.  Rather than switching back and forth between applications, the DirectAcquireTM tool delivers mapping, linescan, and specta applications to the user with only one-click of the mouse.

Direct AcquireTM Spectra allows the analyst to collect spot, freehand, and rectangle areas to directly from the SEM Image.

Direct AcquireTM Mapping gives the user the power of the full mapping application directly from the SEM image.

Direct AcquireTM Linescan gives the user the power of the full linescan application directly from the SEM image.

 

Automation

RoboStageTM is the future of x-ray analysis automation. Conduct multipoint analysis, across multiple locations. Stage automation software allows users to set locations for analysis, adjust image magnification, and then collect images, maps, spectra, and linescans all from an unattended SEM.

FEATURED MAPPING TOOLS

Map Stitching and Montage allows the analyst to map multiple areas and paste or “stitch” the results together.  Map entire sample stubs and large samples by using montage to create a single data-accessible map.   Once the map has been montaged, the user has full access a complete suite of standard mapping applications.

Composition Mapping/Phase Identification-Identify phases or create custom compositional maps by entering desired elements and compounds.  Composition maps can be edited, measurements may be applied, and all data may be saved, mined, and exported.

Intensities and Concentrations may be viewed interactively directly from acquired maps. “Click and drag” over maps to search intensities/concentrations; extract freehand, area, or spots to view spectra from desired areas on the map.

Maximum Pixel Spectrum (MPS)TM locates elements that may be present in very low concentrations.  Identify peaks from the MPS; generate new maps by selecting desired peaks for processing.

Beam Drift Correction protects against any “drifting” that the electron beam might incur during long mapping sessions.  The system will correct any deviations  from the desired mapping area and create a log.

 

FEATURED SPECTRA TOOLS

Point and Shoot anywhere on your SEM image. Custom locations and areas may be defined for automated spectrum acquisition.

Spectrum Synthesis generates a custom spectrum from user-defined concentrations.  Use the spectrum synthesis tool to compare unknowns, standards, and other samples.

Quantitative Spectral Matching allows unknown samples to be matched against single or multiple directories of stored standards.

FEATURED IMAGING TOOLS

Morphology measures feature size with complete image processing capability. Criteria sizing and automated spectrum acquisition create quantitative reports with efficiency.

Image Annotation toolbar enables the analyst to quickly add text, measure features, overlay logos, export images and much more.

Segmentation gives the analyst the power to quickly analyze images, processing phase data based upon grayscale.  Choose custom colors and easily export for rapid report generation.

Stitching and Montage mends multiple small-area sample images into a single comprehensive large-area image.   Apply all imaging and annotation tools to the newly created stitched/montaged image.

Particle Analysis in IridiumUltraTM is unparalleled. With more power than any other software package available, full automation creates incredible, unattended reports in Microsoft Access.

FEATURED LINESCAN TOOLS

Multi-element Linescans in Iridium Ultra TM can acquire up to 31 elements simultaneously.  Overlay, add text, analyze features, export, as well as extract data.

Intensities and Concentrations may be viewed interactively directly from acquired linescans. “Click and drag” over linescans to search intensities/concentrations.

 

NAVIGATION and DATA 

COMPLETE DATA SET PROJECT MANAGEMENT

EDS DataSetTM stores all EDS data in a single file. That means all spectra, images, maps, and  linescans, can all be saved and recalled from a single project file.

INTERACTIVE NAVIGATION PANEL

The Iridium Ultra TM Navigation Panel makes microanalysis efficient and easy by stepping the analyst through software applications while maintaining the flexibility to move between applications.

DATA TREE

Iridium Ultra TM Data Tree conveniently displays stored data with icons for quick storage and recall.Iridium Ultra TM Data Tree conveniently displays stored data with icons for quick storage and recall.

CUSTOM REPORT GENERATION

Custom Microsoft Word Reporting utilizes all the power of MS Word without leaving the Iridium UltraTM software. Custom MS Word Reports may be created and stored for easy recall and generations.

 
Superior Value, Greater Innovation.

Just a few reasons why customers choose IXRF Systems over other EDX brands:

1. Value Proposition:

  • Software: IXRF demonstrates  packages more features than its competitors on every platform! Whether you’re a basic or advanced user we guarantee you will find more Science in SoftwareTM  in the IXRF package than on other industry offerings.

 

  • Detectors: IXRF offers higher resolution detectors as a standard on all system configurations. However we don’t stop there; IXRF also matches the highest resolution premium detectors available to the market.

 

  • Pricing: IXRF recognizes price sensitivity can be an issue for customers looking to purchase microanalysis tools; as a symbol of our commitment to customer satisfaction, IXRF is willing to price match any competitor with similar features and detector specifications!

 

  • Service: IXRF has positioned itself as the industry-leader in service and technical support. We offer longer warranty periods, more reasonable service contracts, and faster response time than other EDX vendors. As a testament to our customer-base relationship and commitment to service IXRF offers: FREE SOFTWARE UPGRADES for life!  (Lifetime License with system)


2. Innovation:

  • Design:
    • The IXRF analyzer leads the industry as the only processor that is based upon an Ethernet platform. This means easier installation and diagnostics as well as faster imaging and SEM communication.

 

  •  
    • The IXRF system is currently the ONLY EDX offering  that utilizes a single PC. Where other vendors must configure a separate PC in addition to the SEM operating system, the IXRF is directly interfaced with the microscope PC--1 keyboard, 1 mouse without any additional configuration. This is true seamless integration.

 

  • Synergy: 
    •  Micro-XRF: IXRF exclusively offers fully integrated X-ray Fluorescence (XRF) tools for the SEM in order to achieve:
    • Improved accuracy, 
    • Increased sensitivity, and 
    • Greater peak separation.

 

  • Speed:
    • Micro-Stages: IXRF also packages micro-piezo stages to decrease sample run-time and increase sample quantities. When combined with our custom automation software, the IXRF System is the fastest EDX system available to the industry--guaranteed.

Click here for a small sample of those that find solutions from IXRF Systems.  

 

 

 
Add Micro-XRF to Your Microscope!

In just 15 minutes customers can view the power of XRF inside the SEM:  Improved Accuracy, Increased Sensitivity, Greater Peak Separation, and more...

Here's a quick link to show you how we iXRF (integrate X-Ray Fluorescence):    Combined EDX and XRF