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In order to make the most informed decision on a microanalysis (EDS/EDX) purchase, one should evaluate the market offerings. At IXRF we are confident our microanalysis offerings demonstrate value, innovation, price, and service superiority. Don't believe us? Make the comparison yourself! Below is a list of our offerings. ALL OPTIONS ARE INCLUDED AS STANDARD. Packages come with FREE SOFTWARE UPRGRADES FOR LIFE; never pay for another piece of software again, period!
We've also included a list of the current market competitors to assist your comparison.
Contact IXRF Systems to schedule a live demonstration of our Science in SoftwareTM and discuss how we create value and continue to innovate for each of our customers! 1-281-286-6485.
IXRF vs. OTHER EDX VENDOR SPECIFICATIONS EVALUATION
(OTHER EDX VENDORS: EDAX, OXFORD, BRUKER, THERMO)
| EDS systems for SEMs (SDD Detectors and Software) |
IridUltra+ PREMIUM
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| SDD detectors |
Part Number |
Resolution (eV) |
Range |
Active Area (mm2) |
Feature |
| SDD 3810 |
3810 |
138 |
B-Pu |
10 |
Y |
| SDD 3510 |
3510 |
135 |
Be-Pu |
10 |
Y |
| SDD 3310 |
3310 |
133 |
Be-Pu |
10 |
Y |
| SDD 2810 |
2810 |
128 |
Be-Pu |
10 |
Y |
| SDD 2610 |
2610 |
126 |
Be-Pu |
10 |
Y |
| SDD 3330 |
3330 |
133 |
Be-Pu |
30 |
Y |
| SDD 3360 |
3360 |
133 |
Be-Pu |
60 |
Y |
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Iridium UltraTM Software Options
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| SPECTRA |
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| IU-CALIBRATE |
Custom Sample Calibration |
Inc. |
| IU-AUTOACQUIRE |
AutoAcquire (kV, ID, Quant) |
Inc. |
| IU-GAUSS |
Gaussian Deconvolution Separation |
Inc. |
| IU-ANNOT |
Spectrum Annotations |
Inc. |
| IU-CHART |
Interactive Periodic Chart (Custom/Scrolling Markers) |
Inc. |
| IU-DIRECT SPECTRA |
Direct Acquire Spectra |
Inc. |
| IU-EXPORT |
File Export |
Inc. |
| IU-SPECTRA |
Drag and Drop Spectra Overlay |
Inc. |
| IU-REPORT |
InstaFLOW (Custom Word Reporting; Flow EDS Data) |
Inc. |
| IU-MATCH |
Spectrum Matching |
Inc. |
| IU-SYNTH |
Spectrum Synthesis |
Inc. |
| IU-VPQUANT |
Variable Pressure Quant |
Inc. |
| IU-ZAF |
Quantitative ZAF |
Inc. |
|
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| IMAGING |
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| IU-ACQUIRE |
Image Acquisition |
Inc. |
| IU-TOOL |
Analysis Suite (Toolbar) |
Inc. |
| IU-HISTO |
Histogram Equalization |
Inc. |
| IU-FILTER |
Kernel Filter (Custom Filters) |
Inc. |
| IU-MORPH |
Morphology |
Inc. |
| IU-SEGMENT |
Segmentation |
Inc. |
| IU-STITCH |
Stitching/Montage |
Inc. |
|
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| MAPPING |
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| IU-QUANTMAP |
Multielement Quantitative Mapping |
Inc. |
| IU-MAPOVERLAY |
Overlay Maps |
Inc. |
| IU-MAPTOOL |
Map Analysis Suite (Toolbar) |
Inc. |
| IU-EXTRACTSPECTRA |
Extract Spectra (Freehand, Spot, Area) |
Inc. |
| IU-LINESCAN |
Extract Linescan |
Inc. |
| IU-DATAVIEW |
DataView (Intensity/Concentration) |
Inc. |
| IU-DRIFT |
Beam drift correction (Requires SEM control) |
Inc. |
| IU-MPS |
Maximum Pixel Spectrum |
Inc. |
| IU-MONTAGE |
Map stitch & montage (Requires SEM control) |
Inc. |
| IU-SEM CONTROL |
Automate Stage and Beam automation (SEM control) |
Inc. |
| IU-PHASE |
Composition Mapping (Phase Analysis) |
Inc. |
|
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| LINESCAN |
|
| IU-LINE |
Multielement Linescan Acquisition |
Inc. |
| IU-LINEOVERLAY |
Linescan Overlay |
Inc. |
| IU-DATAVIEW |
DataView (Intensity/Concentration) |
Inc. |
| IU-MULTI |
MultiScan |
inc |
|
|
| OTHER (Specialty) |
|
| IU-ROBO |
Full Stage Automation |
Inc. |
| IU-PARTICLE |
Iridum Feature Particle Analysis/GSR |
Inc |
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Warranty
|
|
|
|
|
|
| Computer/Analyzer |
3 years |
| SDD Detector |
1 year |
| Extended Warranty Contract (COMPUTER/ANALYZER/DETECTOR w/contract) |
3 years |
|
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PREMIUM IXRF SOFTWARE SPECIFICATIONS OFFERED AS STANDARD!
(OTHER EDX VENDORS EITHER DO NOT OFFER OR INCLUDE AS COSTLY “OPTIONS”)
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Iridium Ultra—Direct AcquireTM tools introduce unprecedented precision to microanalysis data collection. This feature offers users unfettered access to all aspects of x-ray analysis directly from the SEM image. Rather than switching back and forth between applications, the DirectAcquireTM tool delivers mapping, linescan, and specta applications to the user with only one-click of the mouse.
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Automation
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RoboStageTM is the future of x-ray analysis automation. Conduct multipoint analysis, across multiple locations. Stage automation software allows users to set locations for analysis, adjust image magnification, and then collect images, maps, spectra, and linescans all from an unattended SEM.
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FEATURED MAPPING TOOLS
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Map Stitching and Montage allows the analyst to map multiple areas and paste or “stitch” the results together. Map entire sample stubs and large samples by using montage to create a single data-accessible map. Once the map has been montaged, the user has full access a complete suite of standard mapping applications.
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Composition Mapping/Phase Identification-Identify phases or create custom compositional maps by entering desired elements and compounds. Composition maps can be edited, measurements may be applied, and all data may be saved, mined, and exported.
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Intensities and Concentrations may be viewed interactively directly from acquired maps. “Click and drag” over maps to search intensities/concentrations; extract freehand, area, or spots to view spectra from desired areas on the map.
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Maximum Pixel Spectrum (MPS)TM locates elements that may be present in very low concentrations. Identify peaks from the MPS; generate new maps by selecting desired peaks for processing.
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Beam Drift Correction protects against any “drifting” that the electron beam might incur during long mapping sessions. The system will correct any deviations from the desired mapping area and create a log.
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FEATURED SPECTRA TOOLS
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Point and Shoot anywhere on your SEM image. Custom locations and areas may be defined for automated spectrum acquisition.
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Spectrum Synthesis generates a custom spectrum from user-defined concentrations. Use the spectrum synthesis tool to compare unknowns, standards, and other samples.
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Quantitative Spectral Matching allows unknown samples to be matched against single or multiple directories of stored standards.
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FEATURED IMAGING TOOLS
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Morphology measures feature size with complete image processing capability. Criteria sizing and automated spectrum acquisition create quantitative reports with efficiency.
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Image Annotation toolbar enables the analyst to quickly add text, measure features, overlay logos, export images and much more.
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Segmentation gives the analyst the power to quickly analyze images, processing phase data based upon grayscale. Choose custom colors and easily export for rapid report generation.
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Stitching and Montage mends multiple small-area sample images into a single comprehensive large-area image. Apply all imaging and annotation tools to the newly created stitched/montaged image.
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Particle Analysis in IridiumUltraTM is unparalleled. With more power than any other software package available, full automation creates incredible, unattended reports in Microsoft Access.
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FEATURED LINESCAN TOOLS
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Multi-element Linescans in Iridium Ultra TM can acquire up to 31 elements simultaneously. Overlay, add text, analyze features, export, as well as extract data.
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Intensities and Concentrations may be viewed interactively directly from acquired linescans. “Click and drag” over linescans to search intensities/concentrations.
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COMPLETE DATA SET PROJECT MANAGEMENT
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EDS DataSetTM stores all EDS data in a single file. That means all spectra, images, maps, and linescans, can all be saved and recalled from a single project file.
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INTERACTIVE NAVIGATION PANEL
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The Iridium Ultra TM Navigation Panel makes microanalysis efficient and easy by stepping the analyst through software applications while maintaining the flexibility to move between applications.
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DATA TREE
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Iridium Ultra TM Data Tree conveniently displays stored data with icons for quick storage and recall.Iridium Ultra TM Data Tree conveniently displays stored data with icons for quick storage and recall.
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CUSTOM REPORT GENERATION
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Custom Microsoft Word Reporting utilizes all the power of MS Word without leaving the Iridium UltraTM software. Custom MS Word Reports may be created and stored for easy recall and generations.
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Just a few reasons why customers choose IXRF Systems over other EDX brands:
1. Value Proposition:
- Software: IXRF demonstrates packages more features than its competitors on every platform! Whether you’re a basic or advanced user we guarantee you will find more Science in SoftwareTM in the IXRF package than on other industry offerings.
- Detectors: IXRF offers higher resolution detectors as a standard on all system configurations. However we don’t stop there; IXRF also matches the highest resolution premium detectors available to the market.
- Pricing: IXRF recognizes price sensitivity can be an issue for customers looking to purchase microanalysis tools; as a symbol of our commitment to customer satisfaction, IXRF is willing to price match any competitor with similar features and detector specifications!
- Service: IXRF has positioned itself as the industry-leader in service and technical support. We offer longer warranty periods, more reasonable service contracts, and faster response time than other EDX vendors. As a testament to our customer-base relationship and commitment to service IXRF offers: FREE SOFTWARE UPGRADES for life! (Lifetime License with system)
2. Innovation:
- Design:
- The IXRF analyzer leads the industry as the only processor that is based upon an Ethernet platform. This means easier installation and diagnostics as well as faster imaging and SEM communication.
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- The IXRF system is currently the ONLY EDX offering that utilizes a single PC. Where other vendors must configure a separate PC in addition to the SEM operating system, the IXRF is directly interfaced with the microscope PC--1 keyboard, 1 mouse without any additional configuration. This is true seamless integration.
- Synergy:
- Micro-XRF: IXRF exclusively offers fully integrated X-ray Fluorescence (XRF) tools for the SEM in order to achieve:
- Improved accuracy,
- Increased sensitivity, and
- Greater peak separation.
- Speed:
- Micro-Stages: IXRF also packages micro-piezo stages to decrease sample run-time and increase sample quantities. When combined with our custom automation software, the IXRF System is the fastest EDX system available to the industry--guaranteed.
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Click here for a small sample of those that find solutions from IXRF Systems.
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In just 15 minutes customers can view the power of XRF inside the SEM: Improved Accuracy, Increased Sensitivity, Greater Peak Separation, and more...
Here's a quick link to show you how we iXRF (integrate X-Ray Fluorescence): Combined EDX and XRF
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