EDS System: EDS, PC, Detector, and Installation
Free software upgrades, via the Internet, for as long as you own the system!
Advanced Features (included with every system)
- Complete spectrum processing including escape and sum peak removal, automatic background removal, and net peak extractions using Gaussian deconvolution
- Quantitative analysis using ZAF, with or without standards
- Quantitative Spectral Matching
Model 500 EDS Hardware
- Digital Pulse Processor with programmable gain and pulse pileup rejection
- Programmable time constants 0.3, 0.5, 1, 2, 4, 8, 16, 32 (microseconds)
- 32-bit, 4096 channel multi-channel analyzer (MCA) PCI interface card
- Automatic energy calibration
- Adjustable detector bias
- LN Monitor with bias shutdown for detector warm up protection
- Digital Pulse Processor logic is downloaded from the PC for simple field upgrades
- Built in, on board oscilloscope
- Width x Height x Depth 315 x 112 x 250 mm (12.4 x 4.4 x 9.8 inches)
- Weight 4.5 kg (10 lbs.)
- Voltage 100/120/220/240 V AC user selectable. 47-63 Hz, 85 VA Maximum
- Safety Standard EN61010-1 Electrical equipment for lab use, Electro Magnetic Compliance
EN55022 Class A, EN50082-1, CE-mark
EDS Software
- Collection of spectra into 25 (maximum) individual windows
- 0 to 40 keV spectral range at 10 eV per channel
- One click operation for acquisition, automatic peak identification, customizable spectrum processing, and quantification
- Text overlay on spectra that can be saved with spectra
- Export of spectra to standard image file formats (e.g., TIFF, JPEG)
- Point and click cursor displays energy, counts, and possible elements present
- Customizable Automatic element identification and labeling of peak
- Identification of peaks through periodic table or elemental buttons
- Customizable spectrum display (colors and fonts) for both on-screen display and printing
- Complete customization of analysis report output
- Microscope geometry setup and take-off angle calculator
- Detector crystal and window setup calculator
- Spectral overlay for comparison or background removal
- One-click quantitative analysis
- Automatic sum and escape peak removal
- Automatic correction for background using one of four background removal methods
- Automatic peak-overlap correction using Linear or Non-Linear Gaussian deconvolution (no pre-acquired peak profiles required)
- K-ratio determination
- Automatic Standardless Quantification using ZAF (SEM) and Cliff-Lorimer (TEM) algorithms
- including correction for inter-element effects
- Full capability for analysis with pure-element standards, compound standards, or standardless, or any combination
- Qualitative Spectral Matching using stored spectra
- Quantitative Spectral Matching using standards
- Analysis Settings files store all quantitative analysis settings, ensuring consistent, repeatable analysis of each sample type
- Combine multiple analyses into a single tabulated report
- Component Calculator provides quantitative analysis with compounds (e.g., oxides)
- Si(Li) detector crystal with 10 mm2 active area
- 133 eV resolution at FWHM at Mn (5.90 keV)
- 81 eV resolution at FWHM at F (0.68 keV)
- 20,000:1 Peak-to-Background ratio
- Capable of detecting elements down to and including Boron
- Moxtek thin window capable of withstanding atmospheric pressure
- 7.5 liter Dewar with 5-day cooling capacity