IXRF Company Information

IXRF Systems was incorporated on October 1st, 1993 in the state of Texas.  The company originally began by upgrading Kevex bulk X-ray Fluorescence systems to modern Windows based systems.  It is from these XRF beginnings that the name IXRF is derived.   IXRF quickly expanded it's product offerings to include Microanalysis systems.   Today, Microanalysis systems make up the majority of IXRF's business, however adding XRF (X-ray Fluorescence) is being accepted rapidly, coining the phrase "iXRF" meaning "Integrated XRF" in the SEM.

IXRF's current products include 

Advantages

Product History

 

•1993: Los Alamos National Lab receives the first IXRF system.
•1995: Digital Imaging, Feature analysis, and X-Ray mapping are added into the systems.
•1997: IXRF completes the First 100% Integrated EDS Microanalysis system in history (developed for  LEO Electron Microscopy).
•1998: Jetscan Engine Health Monitor wins a millennium award from the British government (developed for LEO Electron Microscopy).
•1999: IXRF completes “Particle Scan” offering the first truly integrated Particle Analysis inside the

           operating system of the SEM (developed for LEO Electron Microscopy).

•1999: IXRF designs a new hardware interface allowing the use of Oxford PentaFET detectors for upgrading

           existing EDS customers.

•2000: IXRF completes the Second fully integrated EDS system, this time for JEOL Ltd product line.
•2001: IXRF completes Particle Analysis on the Integrated JEOL Ltd product line.
•2002: IXRF mounts the first XRF tube on an SEM, to offer the first fully-integrated XRF and EDS

           microanalysis within the SEM.

•2003: IXRF completes Third fully integrated EDS system for TESCAN Digital Microscopy.
•2004: IXRF releases first ever combined EDS/XRF quantitative analysis
•2005: X-Beam produces EDXRF 40 micron X-ray maps and is configured for automated particle analysis
•2006: XRF successfully combines EDS and XRF into a single Quantitative Routine. RoboStage, Image Stitching, X-ray Map Stitching added.
•2007: Release of the 550i converting the IXRF electronics to Ethernet adapting to any PC-SEM eliminating the need for a second computer

 

About the People

The people involved with IXRF have been designing and manufacturing x-ray instrumentation for over 31 years.

Per Sjoman, CEO IXRF Systems, Inc.,
CEO and Hardware Designer, since 1993 - present
Background
Kevex Instruments, Senior Electronics Engineer (designer of Sesame and Sigma hardware), 19 years

Rich Lamb, VP IXRF Systems, Inc.,
VP and Software Development, since 1993 - present
Background
Kevex Instruments, Senior Programmer XRF and Microanalysis, 12 years, Topometrix, Senior Programmer, 3 years

Brian Cross, Ph.D., Owner CrossRoads Scientific
IXRF Systems, Inc., Senior Scientist/Consultant, since 1993 - present
Background
Link Analytical (Oxford Instruments), 4 years, Tracor Northern (Noran), 2 years
Tracor Northern (Noran), 2 years
Kevex, Senior Scientist (including Software Manager for Sigma Microanalysis system design), 10 years
IXRF Systems, Inc., Software Programmer/Consultant, since 1993

Bernie Ware, Imaging Specialist IXRF Systems, Inc.
IXRF Systems, Inc., Imaging Specialist (new and old SEM's), since 1993 - present
Background
Kevex Instruments, Senior Imaging Engineer, (Sesame and current Sigma hardware), 21 years.
IXRF Systems, Inc., Imaging Specialist, since 1993 - present

Kenny Witherspoon, VP Marketing IXRF Systems, Inc.
IXRF Systems, Inc., VP Marketing, since 1993 - present
Background
Kevex Instruments, Installation/Applications and Technical Support Engineer. (Customer service and Marketing), 5 years.

Jim Fontinopoulos, Installation/Applications and Technical Support Engineer 1999-present

John Mongiello, Installation/Applications and Technical Support Engineer 1999- present

Amber Sailer, Senior Marketing Specialist 2005-present

Cristin O'Bryan, Senior Account Manager 2006-present