IXRF offers new EDS systems for just about any Scanning Electron Microscope. With a software suite that boast's it's "easy of use", we provide additionally features that come standard, and not as costly options. It's been sixteen years now providing the very best products that have come to be a "house hold" name in Microanalysis. Our customer list reads like a "Who's who" in the scientific community. One of the biggest selling points, is in taking care of our customers. This is accomplished by developing new software features and giving them to all of our customers as free software downloads as long as you own our system. You've invested in us. We strive to make you never regret your purchase, and always feel that you bought the best! Welcome to IXRF EDS!

A Complete Energy Dispersive X-ray Microanalysis system for use on a Scanning Electron Microscope. 

Main system components include:

· IXRF 550i High Resolution Ethernet EDS System. System incorporates Active Imaging combined with Digital Processing X-ray Electronics. Ethernet is 10/100 megabits/second for easy adaptation to any PC Networking system. 4096 multi-channel analyzer. CE Certified fully digital X-ray acquisition and detector control with Liquid Nitrogen built in warm up protection. Single module combines Imaging and X-ray electronics.  Width x Height x Depth ( 12.4 x 4.4 x 9.8 inches).

· Data Streaming Multiple buffers provide optimal mapping efficiency to support high count rate applications.

· LCD Display Displays count rate, detector voltages, oscilloscope functions.

· Windows XP MicrosoftTM Software Platform – The very latest  programming platform offered by Microsoft. All data, Analysis, and PC peripherals are fully supported.

EDS2006 Advanced Direct Acquire Features:

- Carry out qualitative and quantitative spectral analysis from any area of the SEM Image, manually or automatically

- Acquire elemental X-ray Maps from multiple areas including non-square regions from the SEM Image

- Acquire elemental Linescans diagonally, vertically, or horizontally from the SEM Image

Feature Analysis suite:

Features for the "New" user  in EDX Microanalysis:

* Interactive Help - HTML tutor panels for analytical step by step guidance for common tasks

* On-line Manual - Complete user manuals throughout the software

* Data Tree feature - Allows simple and logical data management for users (built in “Explorer View”)

* Reporting - Allowing professional report generation through “custom” Microsoft WordTM reports

 

Main Spectral features and abilities of the EDS2006 are: 

Automatic Peak Identification, Spectrum Compare (drag and drop), Standardless quantification using ZAF, standardization, with our without pure or compound standards. Customizable Gaussian Deconvolution. Automatically updates kV and Magnification (communication with SEM required). All Spectral settings can be customized for sample type or user preference. Scrolling element markers, custom element marker adjustment along with auto peak marker scaling. Automatically adjusts the quantitative results using the background data for charging samples or variable pressure applications.

 

· Interactive Help System - Software includes Four Interactive Help panels: Spectrum Analyzer, Image Analysis, Spectral Mapping and Spectral Linescans. These panels help the user to navigate through the software to simplify analytical tasks so even the novice user can operate the system at the highest level of confidence.

 

· Spectral Mapping -This allows the user to analyze saved spectral image FastMapTM data by storing a complete EDS spectrum with every pixel on the SEM Image. Complete chemical and morphological data can be obtained without reacquisition of the map. Extract EDS spectra from any region or group of image pixels. View chemical composition from individual elements or compounds by entering concentrations. 31 elemental maps can be simultaneously acquired at 2046 x 2046 resolutions. Multi frame mapping with pixel addition at 100 microseconds per frame.

· Direct Acquire - Click on any region of the SEM image to collect Spectra individually or automatically, Auto Peak identification and quantification without user interaction. Area raster, Free Hand tool, Spot mode, Linescans, X-ray Mapping on the SEM Image using the mouse to save all data, along with the regions of analysis in one single file (EDS Data Set). 

· Feature Analysis- Offered as a standard, not an option, is the ability to measure Image and X-ray map features with a fully loaded software suite of measurement tools. Classify features by size and/or chemical composition with the “AutoRecipe Wizard” to perform automatic image processing with the click of the mouse.

· Automated Particle Analysis (Single Field)- Offered as part of standard EDS package allowing complete automated image analysis combined with EDS analysis. All image and EDS data is stored via Microsoft Access TM database file formats.

· Drift Correction software-  Drift tracking software for X-ray mapping. Software locks on to features and moves as the specimen drifts to keep the maps consistent.

· Image Stitching-  This feature allows for the collection of multiple images either automated or manually to combine images into a single image file. The image can then be processed with all of the feature analysis tools provided by IXRF.

· X-Ray Map Stitching-  This feature allows for multiple maps to be collected either manually or automatically to create “Mosaic's to be combined into a single X-ray map. All IXRF mapping features can then be applied to the stitched map.

· Data Cube- analysis performed on Mosaics which stores all  x-ray data points with the SEM image. Pixels can be extracted to form complete spectra and quantified.

· RoboStage– The most sophisticated stage automation to date. This feature allows for the user to predefine specific areas on a sample. The motorized stage will then go to each defined area and perform the following: Acquire a single spectrum of the area being scanned. A single image will be acquired. A fast X-ray map (with stored spectra). Fast Linescans (with stored spectra). Stage X-ray map (large area mapping) all combined automatically into a single Data Set with automatic beam shut off.  Stage Automation Required.

Complete Specifications: 

Model 550i EDS Data Acquisition/Digital Imaging Electronics

· State-of-the-Art Ethernet X-ray Electronic interface 10/100 megabits per second

· Digital Pulse Processor with programmable gain and threshold adjustment

· X-ray Processing time constants 0.3, 0.5, 1, 2, 4, 8, 16, 32 (microseconds)

· 4096 channel multi-channel analyzer (MCA) Ethernet Interface

· Automatic energy calibration

· Adjustable detector bias

· Digital Pulse Processor logic is downloaded from the PC for simple field upgrades

· Built in, on board oscilloscope

· Two Video Inputs

· Width x Height x Depth 315 x 112 x 250 mm (12.4 x 4.4 x 9.8 inches)

· Weight 4.5 kg (10 lbs.)

· Voltage 100/120/220/240 V AC user selectable. 47-63 Hz, 85 VA Maximum

· Safety Standard EN61010-1 Electrical equipment for lab use, Electro Magnetic Compliance EN55022 Class A,    EN50082-1, CE-mark

  

EDS Software

· Collection of spectra into individual windows

· 0 to 40 keV spectral range at 10 eV per channel

· One click operation for acquisition, automatic peak identification, and quantification

· Customizable spectrum processing, and quantification

· Complete annotation tools for spectra

· Export of spectra to standard image file formats (e.g., TIFF, JPEG, 51 formats)

· Point and click cursor displays energy, counts, and possible elements present

· Customizable automatic element identification and labeling of peaks

· Identification of peaks through periodic table or elemental buttons

· Scrolling markers from element chart on spectra

· Customizable, independent spectrum display (colors and fonts) for both on-screen display and printing

· Complete customization of analysis report output via MS Word

· Microscope geometry setup and take-off angle calculator

· Detector crystal and window setup calculator

· Spectral overlay utilizing “Drag and Drop” technology

· Interactive Help System steps the user through various analytical techniques

 

EDS Quantitative Analysis Software

· One-click quantitative analysis

· Automatic sum and escape peak removal

· Automatic correction for background using one of four background removal methods

· Customizable automatic peak identification

· Automatic peak-overlap correction using Linear or Non-Linear Gaussian Deconvolution (no pre-acquired peak profiles required)

· K-ratio determination

· Automatic Standardless Quantification using ZAF

· Full capability for analysis with pure-element standards, compound standards, standardless, or any combination

· Qualitative Spectral Matching using stored spectra

· Quantitative Spectral Matching using standards

· Least Squares quantitative analysis using standards

· Analysis settings files store all quantitative analysis settings, ensuring consistent, repeatable analysis of each sample type

· Combine multiple analyses into a single tabulated report

· Component Calculator provides quantitative analysis with compounds (e.g.,  oxides)

· Customizable automatic peak identification

· The ability to combine different analytical routines to different elements

· The ability to combine XRF and EDS analysis

· Spectrum Synthesis

 

X-ray Mapping and Linescans

· One-click acquisition of X-ray maps - label the peaks on the spectrum and select any region on the image with your mouse to create multiple X-ray maps

· Maximum Pixel Mapping Technology (NIST)

· FastMapTM and FastLinescanTM technologies store all spectral data and their locations

· Maximum X-ray map resolutions (per element) is 2048 x 2048 for 31 elements simultaneously

· Rapid and flexible map acquisitions using point dwell times as short as 10 microseconds

· Live spectrum display during X-ray map acquisitions

· Maps are displayed in 24-bit color

· Simultaneous acquisitions of 31 X-ray maps with SEM image and spectra

· Composite Component maps can be overlaid on the SEM image

· Real-time quantitative analysis and spectral display at each map pixel

· Multiple Frame X-Ray Map frame averaging

· Definable Phase mapping by Wt%

·  Create additional element X-ray maps and Linescans without re-acquiring the X-ray map using the FastMapTM and FastLinescanTM

· Export X-ray maps to standard image files (e.g., TIFF, JPEG, 51+ formats including ASCII )

· Export Maps as "Whole Image"

· kV, Magnification, and scalable Micron Bar overlaid on X-ray maps

· Extract Linescans from X-ray maps

· Overlay Linescans on Image or each other

· User definable Linescans (diagonal)

· Interactive Help System steps user through various analytical techniques

· Combine X-ray map pixels to extract complete x-ray spectra and produce quantitative analysis for the spectra

· Drift correction and feature tracking

· Feature/ measurement tools for x-ray maps

· Complete processing including Background removal and Gaussian Deconvolution

· The ability to “stitch” multiple Linescans together (StageScanTM) utilizes motorized stage

· Quantitative Linescans with or without standards

· The ability to “stitch” multiple X-ray Maps together, utilizes motorized stage or can be performed manually

· Robo-Stage: The ability to automatically acquire Images, X-ray Spectra, X-ray Maps, X-ray Linescans, Stitched Images, Stitched X-ray Maps, Stage X-ray Maps and Stage Linescans while keeping track of all stage locations and magnifications. Beam shut down on completion.

· Extract X-ray spectra from X-ray Maps as spot (per pixel) or grouped (multiple pixels) and perform quantitation automatically

· Perform Map Processing functions on "Stitched" Maps

· The ability to "Auto Select" elements, create additional maps when new elements are identified

Digital Imaging

· Digital images are rapidly acquired "actively" by taking control of  the SEM scan coils

· Brightness, Contrast, and color palette adjustments

· Display of image gray level histogram

· AC line voltage synchronization

· Acquire images at up to 4096 x 4096 resolution (16 mega pixels)

· Crop/Zoom Images

· Ability to acquire non-square images

· Image pixel averaging: 2, 4, 8, or 16

· Image Frame Averaging

· Acquisition of gray scale in 12-bit resolution

· Display images at 24-bit color resolution (16.7 million colors)

· Image file browser displays "thumbnail" view of files for easy selection

· Annotate images with a variety of sophisticated interactive measurement tools

· Export images to standard image file formats (e.g., TIFF, JPEG, 51+ file formats)

· Import images from a variety of image formats (TIFF, JPEG, etc)

· Multi-point analysis, for unattended spectral data collection, and processing from selected points on the SEM Image

· Adjustable Micron Marker, Magnification, and kV displayed on image

· Imaging hardware and software calibrated to SEM magnification

· Interactive Help System steps user through various analytical techniques

 

Image Processing

· Image processing steps are stored with the image macro recorder

· Border particle removal

· Particle sorting by dimensional criteria

· Particle exclusion by feature measurements

· Particle classification by chemical composition (EDS data)

· Electron-beam control for feature scanning or spot-mode analysis

· Histogram equalization

· User definable kernels of 3x3, 5x5, 7x7 and 9x9 formats

· Erosion, dilation, hole filling, and skeletonization

· Smoothing, sharpening, median filtering

· Sobel, Laplace, vertical, and horizontal edge filtering

· Binarization of images

· Morphological processing for rapid feature size measurements

· Customizable report generation including histograms and scatter plots

· All data, including the image and EDS spectra, are stored in MS Access database

· 24 feature measurement functions with specific criteria capabilities

· Wizard approach for macro recording of the above features

 

Automated Particle Analysis (Multiple Fields)

· Particle analytical data stored in Microsoft AccessTM database

· Multiple sample stub setup for automated analysis

· Customizable sample holder setup to accommodate just about any sample holder

· Particle analysis setup based on simple “Wizard” approach

· Image processing stored with Image Macro Recorder

· Border particle removal

· Particle sorting by dimensional criteria

· Particle sorting by chemical composition (EDS data)

· Customizable report generation for scatter plotting and particle distribution

· Image, processed image, and EDS spectra stored with each analysis

· Wizard approach for macro recording of the above features

 

XRF Features (Option)

*Standardless XRF Quantitation

*Complete XRF Matrix Correction Software

*Combined FP (Fundamental Parameters) and ZAF Quantitative routines combined into a single quantitative method

*XRF Elemental Stage Linescans

*XRF Elemental Stage X-ray Mapping with resolutions of 2046 per element (31 elements simultaneously)

*System Geometery and XRF configuaration calibration for quantitative analysis

*Multi-Layer Thin Film Coating Quantitative Software

*Spot Location Software

Installation and software familiarization of EDS2006 -  Includes a 2-3 day visit for on-site training/installation of the IXRF EDS2006 system, U.S. Only.

WARRANTY: 

All EDS systems sold by IXRF Systems, Inc. are supplied with a complete 3 year part and labor warranty.

All SDD Detectors sold by IXRF Systems, Inc. are supplied with a 1 year part & labor warranty.

All Si-Li Detectors that are Ln2 cooled, carry a 3 year warranty.

 

Particle Analysis and Stage Automation Included

EDS2006 Microanalysis System with 10mm2   133eV SDD detector  $62,000.00

EDS2006 Microanalysis System with 10mm2 129eV SDD detector List $60,000.00

EDS2006 Microanalysis System with 30mm2 133eV SDD detector List $62,000.00

EDS2006 Microanalysis System with 10mm2 129eV Ln Cooled  detector List $55,000.00

Net 30 Terms will automatically start form the day equipment  ships to customer site.

Specifications and features are subject to change without notice. 

 The IXRF EDS2006 Microanalysis System and More!

XRF Systems, Inc. reserves the right to change specifications without notice.
IXRF SYSTEMS, Inc.
15715 Brookford Drive, Houston, TX 77059, U.S.A.
Tel: 281/286-6485 Fax: 281/286-2660