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IXRF Systems is a preeminent progressive analytical instrumentation company in the microanalysis industry. Constant innovation keeps IXRF Systems positioned as a true pioneer in EDS/EDX and XRF products for the scanning electron microscopy community.
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Microanalysis (EDS/EDX)
IXRF offers fully-automated EDS/EDX systems for practically any SEM. The IXRF Iridium Ultra™ software suite boasts advanced analytical tools for even the most basic user. The IXRF EDS/EDX system is compatible with new silicon drift detectors (SDD) as well as any existing LN2SiLi detector.
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X-Ray Fluorescence (XRF)
X-Ray Fluorescence (XRF) is a powerful technique used to quickly analyze samples for nearly all elements on the periodic table above Na; low ppm levels to 100-wt% can be analyzed in seconds. IXRF Systems adapts this technology to the scanning electron microscope (SEM) eliminating the need for a separate XRF unit. Combining XRF and the electron beam brings two technologies together on a single sample, in the same location, at the same time!
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Detectors
IXRF Systems offers a wide variety of x-ray detectors. From liquid nitrogen cooled, to the new SDD (Silicon Drift Detector) which require no liquid nitrogen for cooling and can accept large amounts of x-rays to create very fast x-ray maps. IXRF electronics are optimized to provide true “data streaming” for the fastest x-ray processing possible. Digital Imaging, X-ray Elemental Mapping, and X-ray Spectra, are all computer controlled though the IXRF software and hardware.
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