IXRF Systems Si(Li) detectors represent the state of the art in high performance solid state energy dispersive X-ray detection. Si(Li) detectors are available to suit all applications and are also available in special multi-element designs.
Typical Fe-55 Spectrum (logarithmic scale) from a IXRF 10mm² Si(Li) Detector (Measured spectral parameters: Resolution 128eV, Peak to Background 22k:1)
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Typical specifications for IXRF detectors |
| Active area (mm²) |
10 |
30 |
50 |
80 |
| Resolution [MnKa] (eV) |
127 |
133 |
139 |
148 |
| Peak:Background |
20000:1 |
20000:1 |
15000:1 |
10000:1 |
| Tail factor (%) |
<0.10 |
<0.10 |
<0.12 |
<0.15 |
Low energy response
IXRF Systems detectors offer excellent light element X-ray response. This is an important feature in many analytical applications. Very low energy X-rays do not penetrate very far in Silicon and so most of the events occur very close to the front contact of the crystal, where fractions of the charge are easily lost. This can result in peak broadening, tailing and even energy shifts. IXRF Systems' special front contact technology is crucial to minimising these effects, resulting in excellent spectral performance right down to Beryllium K X-rays.
Ultimately the efficiency of an X-ray detector at the low energy end of the spectrum depends on the choice of entrance window. IXRF offers a comprehensive range of detector windows to suit all applications.
Light Element Spectrum from SEM
High energy response
Applications like X-ray Fluorescence (XRF) often require good spectral response over a wide range of energies. IXRF Systems Si(Li) crystals are available with different active thicknesses depending on the application. Deeper crystals are more efficient at higher X-ray energies. IXRF Systems Si(Li) crystals maintain their excellent peak to background and low tail performance even at high energies (See Pd spectrum below).
Typical IXRF Systems XRF Detector Spectrum (50mm² Si(Li))
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