IXRF Systems, Inc.'s range of electronically cooled (LN free) Silicon Drift Detectors are optimized when coupled with are innovative ethernet based digital pulse processor. Specifically configured to each customer IXRF SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid x-ray maps.

Digital Imaging, X-ray Elemental Mapping, and X-ray Spectra, are all computer controlled though the IXRF software and hardware interface.

The IXRF SDD detector is available in both EDX (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. A choice of window materials are available, from Beryllium (8µm) to Thin Polymer (for light element x-ray transmission) and sensor active areas of 10mm² and 60mm² are offered.

All of our SEM SDD versions are vibration free.

The preamplifier produces industry-standard ramp/restore signals which may be input directly to most analogue or digital pulse processing systems. Another great advantage of this mode of operation is stability of peak centroid and resolution as a function of count rate.

Below are some illustrations of the main features and benefits of the IXRF SDD detector - excellent resolution and stability, light element response for microanalysis applications, and systems for XRF analysis.

 

 

   

Sensor thickness: 500µm (450µm active)

For further information, or to discuss your application in detail, please contact us.