X-Beam

The X-Beam^TM custom x-ray source is designed exclusively for use on electron microscopes.  The compact design, and slide mounting allow very close coupling to the sample. Patented polycapillary optics focus x-ray excitation down to sample areas as small as 10µ. The X-Beam^TM is offered in 10µ and 40µ spot sizes. The integrated high-voltage power supply operates up to a maximum power of 50 watts (35-50 kV and 1.0 mA depending on anode material). The close coupling provides XRF analytical results comparable to those from traditional “’tabletop” or “standalone” units.  The X-Beam^TM is designed so that it does not interfere with the normal operation of the electron microscope, including the use of the electron beam on the same sample, at the same time collecting all elements simultaneously.

No special cooling is required.

But why?

Electron beams (from scanning electron microscopes) produce very high backgrounds hiding the trace elements in the sample. X-rays, from a true “x-ray” source don’t have this effect. Using the X-Beam^TM low ppm levels of elements can be easily identified, quantified, and even producing trace level x-ray maps to view elemental distribution of trace elements in your sample.

Applications: 

• Art and Archeological 
• Chemical 
• Coatings and Thin Film 
• Cosmetic 
• Environmental 
• Food Applications
• Forensics
• Metal and Ore 
• Mineral and Mineral Products
• Petroleum EDXRF
• Pharmaceutical Applications
• Plastics, Polymers, and Rubber
• Plating and Plating Baths
• Other Applications
• Wood Treating Application