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What's New

Enhanced "Trace" elemental analysis in your Scanning Electron Microscope!

IXRF SYSTEMS, INC.(Integrated X-ray Fluorescence Systems, Inc) has recently released an adaptable X-ray Fluorescence (XRF) product to the EDX/EDS Microanalysis community. IXRF currently offers fully-featured EDX/EDS microanalysis systems but brings to the SEM the benefits of traditional table-top XRF analysis; trace capabilities for higher Z elements (Na and above) can be 10-1000 times lower than that of EDX/EDS analysis. A greatly reduced background and more stable beam account for higher quantitative accuracy when using standards. Samples do not have to be coated and sample penetration depths exceed that of the electron beam by 10 fold; this opens up analysis avenues for coating measurements and thin film analysis. When used inside the SEM, XRF applications stand to perform more efficiently than that of traditional table-top methods due to tighter source-sample-detector geometries as well as higher vacuum. When used in combination with EDX/EDS tools, the analyst will benefit from quality low energy/light element analysis via the electron beam as well as the greatly enhanced capability of XRF at the heavier end of the spectrum.

The XRF additions may come packaged with the latest IXRF EDX/EDS tools or may be coupled with any existing EDX/EDS system. Virtually any scope may accommodate the addition depending on port availability. This product is exclusively offered by IXRF SYSTEMS, INC.; it is the first and only of its kind.

X-Beam

The X-Beam is a micro-focusing x-ray source with a Polycapillary Focusing Optic. The X-Beam is capable of producing an excitation area of 40-60 microns at the sample surface. By moving the sample stage under the x-ray beam, X-ray Imaging (X-ray Mapping) is accomplished.

With intensities increased by a factor of 10-100, trace level concentrations are displayed with much higher contrast. Br (green), Bi (yellow), Sn (light pink) and Ag (magenta).

For more on XRF Imaging in the SEM see "Learn More about Applications" on the "Products" page.

IXRF has now added the ability to do Image Stitching. And not just imaging stitching! Our Stitching works with or without motorized stages. It works great in manual mode as well. This allows the user to acquire, re-acquire until you've got your stitched images exactly the way you want.

The above image is purposely out of alignment demonstrating the Stitching ability.

Of course, what would stitching be without the ability to create Stitched X-ray Maps?

Once you've created your Stitched X-ray Maps, we didn't want to leave you with just a map. In other words, what good are X-ray maps if you can't apply all the IXRF tools to it! All IXRF X-ray map functions apply to the Stitched X-ray maps as well.

Enhanced Image Annotations For Digital Imaging

For IXRF systems with Digital Imaging, the latest release includes a suite of new Image Annotation and measurement tools. As with all IXRF products, software upgrades are free. Just download the latest release of the EDS2000 and you can begin to enjoy these latest enhancements.

Annotations even work with X-Ray Maps!

Improved Linescan For EDS2000 Software

For IXRF "Standalone" systems, the latest
release include many customer requests regarding X-ray Linescans.
The improvements are:

X-ray Linescans can be overlaid on each other
X-ray Linescans can be overlaid on the SEM image
X-ray Linescans can be acquired in any direction, not merely horizontal lines, as before
Complete EDS spectra are stored at each location.
Since the spectral data is stored with each location, additional Line profiles can be generated within seconds.

Saving a Spectrum with Every Pixel on you Map (PTS)

One of the most important part of any EDS system is X-Ray mapping. Over the past several years, IXRF has refined its software to providing "high end" features to all of it's customers. By saving a spectrum at each pixel location (complete spectrum), the operator never has to reacquire the sample to create additional maps. All of the spectral data has already been saved!

Image Phase Analysis

Advanced Area Phase Analysis

Feature Measurement with a "click" of the mouse.

Create Custom "Word" Reports without ever leaving our Application!

Custom Microsoft Word^TM reports can be built inside the EDS2000 software package. Create your own company reports with your own logo and style.