Our electronics are optimized to provide true “data streaming” for the fastest x-ray processing possible

IXRF's range of electronically cooled (LN free) Silicon Drift Detectors are optimized when coupled with an innovative ethernet based digital pulse processor. Specifically configured to each customer, IXRF SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid x-ray maps.

The SDD detector is available in both EDS (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. Choices of window materials are available, from Beryllium (8µm) to Thin Polymer (for light element x-ray transmission) and sensor active areas of 10mm² to 60mm² are offered. In addition, all or our SEM SDD versions are vibration free.

Typical Specifications for IXRF SDD Detectors
  Sensor Area Window Options Resolution eV(Mn K/C)
  10mm2 Light Element (AP3.3) or 8µm Be ≤123 - 133
  30mm2 Light Element (AP3.3) or 8µm Be ≤128 - 133
  60mm2 Light Element (AP3.3) or 8µm Be ≤128 - 133

Introducing Benchtop XRF

About Us

Since its incorporation over two decades ago, IXRF Systems has proven itself as a leader in x-ray microanalysis. IXRF uses innovative design and technology for example, IXRF remains the only EDS company capable of using the SEM PC, offering a “One PC Solution.”

Our Location

Contact Us

IXRF Sytems, Inc. reserves the right to change specifications without notice. Copyright 2015 IXRF Systems Inc.

10421 Old Manchaca Rd., Suite 620
Austin, TX 78748
Telephone: 512.386.6100
Fax: 512.386.6105