The ATLAS™ X Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The ATLAS™ X boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (5µ) available on the market. Additionally, the ATLAS™ X is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more. Models may be operated under air or vacuum as well as Helium flush for liquids and light element analysis.

Product Features:


  • Spot Size down to 5 microns with anti-halo optic
  • SDD Detector Active Area up to 150mm2
  • Larger Chamber Volume
  • 50kv/50 watt tub
  • Multipoint/Multi-Area Automation & Mapping
  • Air, Vacuum, Helium for Solids, liquids, and powders 


ATLAS X Specifications

Sample Types

Solids, Liquids, Particles, Powders

Sample Chamber Size

950x650x365mm

Measurement Media
Primary
Secondary


50W / 50kV / 1mA
4W-12W / 40kV-60kV / 0.4mA-1mA

Excitation Parameters
Target Materials
Tube
Spot Size
Filters

Aperture or Polycapillary Collimation
Rh (others available)
50kV, 50W, 1mA (optional 2nd tube)
≤5-1000μ
Up to 8

Geometry

Top-down Beam (Perpendicular)

Detector(s)

SDD (Si-Pin upon request)

Resolution

130-145eV

Active Area

30-150mm2
Stage Motorized X,Y,Z (available)
Up to 600x300mm ranges available
10kg+ load capacity

Sample Travel

Total

600x300x150mm

Mapping

400x300mm

Map Scan Speed

1-3ms/pixel

Sample Speed

up to 300mm/second

Sample View

Three Sample Positioning and Analysis Cameras

Instrument Control

PC; Windows 7/8
Complete control of parameters, filters, cameras, optical microscopes, sample illumination and positioning, and measurement media

Power

100-240 V, 50/60 Hz

Certifications

CE, RoHS, Radiation

Element Range

Na-U

Dimensions

1690mmx787mmx1630mm

Quality and Safety

CE certified RoHS, Radiation ≤1 μSv/h
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Introducing Benchtop XRF




About Us

Since its incorporation over two decades ago, IXRF Systems has proven itself as a leader in x-ray microanalysis. IXRF uses innovative design and technology for example, IXRF remains the only EDS company capable of using the SEM PC, offering a “One PC Solution.”



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IXRF Sytems, Inc. reserves the right to change specifications without notice. Copyright 2015 IXRF Systems Inc.



10421 Old Manchaca Rd., Suite 620
Austin, TX 78748
Telephone: 512.386.6100
Fax: 512.386.6105