IXRF’s range of electronically cooled (LN free) Silicon Drift Detectors (SDD) are optimized when coupled with an innovative ethernet based digital pulse processor. Specifically configured to each customer, IXRF SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid x-ray maps.
The SDD detector is available in both EDS (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. Choices of window materials are available, from Beryllium (8µm) to Thin Polymer (for light element x-ray transmission) and sensor active areas of 10mm² to 100mm² are offered. In addition, all or our SEM SDD versions are vibration free.