SILICON DRIFT DETECTORS

IXRF’s range of electronically cooled (LN free) Silicon Drift Detectors (SDD) are optimized when coupled with an innovative ethernet based digital pulse processor. Specifically configured to each customer, IXRF SDD detectors provide exceptional and stable performance over a wide range of input count rates to produce rapid x-ray maps.

The SDD detector is available in both EDS (SEM mounted with slide assembly) and XRF (various designs, no slide) formats. Choices of window materials are available, from Beryllium (8µm) to Thin Polymer (for light element x-ray transmission) and sensor active areas of 10mm² to 100mm² are offered. In addition, all or our SEM SDD versions are vibration free.

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PRODUCT FEATURES

SAMPLE APPLICATIONS

Archeology/Museums
Museum artifacts and currency
Metals and alloys
Gemstone inclusions
Painting authenticity/dating
Paints, inks, pigments
Corrosion products
Paints
Biomedical devices/implants
Solar cells
Optical filters
Manufacturing
Pathology
Pharmaceuticals
Semiconductor
RoHS, WEEE, and ELV compliance

Environmental analysis
Lead contamination in consumer goods
Packaging
Soil contamination
Material characterization for recycling
Marine/ocean sediments
Airborne particles/air filters
Slurry
Forensic Science
Glass Chips
Paint cross sections
Metals/alloys
Inks/pigments
Soils/stones
Gun shot residue
Material identificaiton

Geological
Meteorites
Phase boundaries
Mineral identification
Mining test cores
Metals and alloys
Electronics
Glasses
Building materials (concrete, cement)
Packaging
Medicine/Biology
Bones/tissue
Leaves/plants
Pharmaceuticals
Implants
Particle Analysis

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