DATA DISCOVERED

SEM-EDX

IXRF offers an all-inclusive high-end software suite featuring a myriad of spectra, mapping, imaging, and advanced automation analysis tools. IXRF couples only premium quality detectors with every system and offers industry leading features, in addition, to unique features no other EDS systems can offer. IXRF offers free software upgrades for the life of the system so the analyst is never out of date.

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SPECTRA OVERVIEW

  • Identifying Elements
  • Spectrum Processing
  • Annotations Annotations
  • Spectrum Overlay
  • Spectrum Reporting

IDENTIFY ELEMENTS

Kα Energy Markers help easily identify elemental peaks

Identify elements through cursor ID by selecting individual energy channels.

SPECTRUM PROCESSING

• Peak separation using Gaussian deconvolution
• Automatic peak-overlap correction
• Automatic escape and sum peak removal
• Automatic Standardless Quantification using ZAF

ANNOTATIONS

Selecting Annotations from the Spectrum toolbar opens a new window that allows the user to measure, label, add text, etc. on the spectrum. These annotations are fully customizable and can be exported with the spectrum.

SPECTRUM OVERLAY

Spectra can be overlaid to easily compare the relative compositions in samples

SPECTRUM REPORTING

Create a simple spreadsheet report of multiple spectra’s quantitative analysis.

IMAGING OVERVIEW

  • Image Acquisition
  • Analysis Suite (Toolbar)
  • Morphology
  • Segmentation
  • Stitching/Montage
  • Automated Particle & Multi-point Analysis

IMAGE DIRECT ACQUIRE

The Direct Acquire tools allow for EDS data to be collected by selecting the region of interest from the SEM image. This includes spot/rectangle/free hand spectra as well as maps and linescans on the image.

MULTIPART ACQUIRE

Multipart Acquire allows fully automated spectrum analysis with customized EDS settings and automatically generated spectrum analysis reports. This includes single point, raster area, and freehand line spectrum acquisition.

SEGMENTATION

Image Segmentation provides a visual representation of different phases in an image. Based upon histogram analysis, you can see the percent area each phase occupies.

MORPHOLOGY

Image Morphology provides particle information through image binarization. Image binarization transforms the image into grayscale based upon histogram data.
This allows you to label and measure pixels to provide an abundance of morphological data.

LINESCANS OVERVIEW

  • Multielement Linescan Acquisition
  • Linescan Overlay
  • DataView (Intensity/Concentration)
  • MultiScan

MAPPING OVERVIEW

  • Mutielement Quantitative Mapping
  • Overlay Maps
  • Map Analysis Suite (Toolbar)
  • Extract Spectra (Freehand, Spot, Area)
  • Extract Linescan
  • DataView (Intensity/Concentration)
  • Beam Drift Correction
  • Maximum Pixel Spectrum
  • Map stitch & montage
  • Automate Stage and Beam automation
  • Composition Mapping
  • Phase Analysis

MAPPING OVERVIEW

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SPECTRA FROM MAP

Combine X-Ray Map pixels to extract spectra from a region of interest

ELEMENTAL INTENSITIES

Selecting Element Intensities from the Map tab will open a new window. A spot/rectangle/freehand can be placed on the image to compare the intensity/concentration.

PHASE MAPS

Selecting Phase Maps from the Map tab will identify different phases within a sample and quantitatively analyze the elements within each phase.

The different phases will be graphically displayed in a map alongside phase-specific overlaid spectra to provide a qualitative comparison.

RATIO MAPS

Analyze the element ratios in a region of interest and displays a comparison of element weight percent ratios.

COMPOSITION MAPPING

Selecting Composition Mapping from the Map tab will identify map locations containing specific element concentrations according to specified parameters.

Quantitative analysis is performed on every pixel where a calculated concentration is compared to a specified concentration. Matching pixels are then displayed in the composition map.

QUANTITATIVE ELEMENT/COMPONENT MAPS

Quantitative Maps convert the displayed pixel data to Concentration (wt%) from Intensity (cps).

This feature can display the quantitative maps as either elemental maps or components maps (ie; oxides).

Our electronics are optimized FOR true “data streaming” and ultra-fast x-ray processing

IXRF’s range of electronically cooled (LN free) Silicon Drift Detectors are optimized when coupled with an innovative ethernet-based digital pulse processor. IXRF SDD detectors provide exceptional and stable performance over a wide range of input count rates.

550i DETAILS

LARGE AREA SEM DETECTOR

STANDARD SEM DETECTOR

TABLETOP SEM DETECTOR

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