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Quantitative analysis
Calculation of the abundance of the elements present in the sample
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Privacy
Terms
Disclaimer
MENU
MENU
Products
EDS & XRF
for Electron Microscopy
SEM/EDS
SEM-XRF
SDD Detectors
SEM Upgrades
micro-XRF
µXRF / µEDXRF
ATLAS M benchtop microXRF
ATLAS X largest microXRF
ATLAS SEMI for metrology
SEM-XRF
Training
Courses / Education
Your Lab
Our Lab XRF
Virtual
Solutions
Alloys & Metals
Application List
ASTM E2926
Botany
Cement
Environmental
Forensics
Geology
Gun Shot Residue
RoHS / WEEE
Semiconductor Metrology
Support
Resources
Articles
App Notes
Demo Videos
FAQs
Google Scholar Articles
Publications
SEM Theory
Training
µEncyclopedia
XRF Theory
News
Press Releases and News
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About
About IXRF Systems
Contact Us
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