Atlas Apex M Benchtop MicroXRF Spectrometer

High-resolution microXRF elemental mapping, hyperspectral XRF imaging, and quantitative micro-scale analysis for research and industrial laboratories

ATLAS Apex M
Concrete section

Atlas Apex M is a benchtop microXRF spectrometer designed for non-destructive elemental mapping, hyperspectral XRF imaging, and quantitative micro-scale analysis of solids, liquids, particles, powders, thin films, and irregular samples. Built by IXRF Systems in Austin, Texas, it combines a high-flux microfocus X-ray source, polycapillary optics, perpendicular excitation geometry, configurable SDD detectors, and Iridium Ultra software to deliver advanced materials characterization for research and industrial laboratories.

Engineered to visualize elemental distributions, identify small features, characterize phases, and quantify materials at the micro-scale, Atlas Apex M supports applications ranging from geology and critical minerals to semiconductors, batteries, coatings, metals, forensics, cultural heritage, environmental research, and advanced materials development. With spatial resolution down to 5 µm, operation in air, vacuum, or helium, and powerful software tools for automated acquisition, hyperspectral mapping, quantitative analysis, phase classification, and data visualization, the system provides the flexibility needed to analyze diverse sample types and complex materials.

Made in USAMicro X-ray fluorescence (µXRF, µEDXRF, micro-XRF, microEDXRF) spectroscopy is an elemental analysis technique that relies on the same principles as X-ray fluorescence (XRF) spectrometry. The difference is that micro x-ray fluorescence (microEDXRF) spectrometry has a spatial resolution with a diameter many orders of magnitude smaller than conventional XRF, WDXRF or EDXRF spectrometers. Practically, microEDXRF spectrometers with high-precision scanning XYZ-stages  — like the ATLAS Apex series —  function as a type of  XRF hyperspectral imaging microscope, where each pixel (in a map or image) contains information from 0.2 – 40 keV in the electromagnetic spectrum.

While a smaller excitation spot can be achieved by restricting X-ray beam using a pinhole aperture, this method blocks much of the X-ray flux which has an adverse effect on the sensitivity of trace elemental analysis. Modern polycapillary focusing X-ray optics are able to create small focal spots of just a few micrometers in diameter. By using such X-ray optics, the IXRF Systems’ ATLAS Apex series of imaging spectrometers provide a tiny focal spot (down to  5 μm, depending on desired configuration) that is much more intense and allows for enhanced trace element analysis and the creation of hyperspectral images of a sample. Micro X-ray fluorescence (μXRF) spectometry is commonly employed in many applications, such as: botany, cement, forensics, small feature evaluations, elemental mapping, mineralogy, metals & alloys, electronics, multi-layered coating analysis, micro-contamination detection, film and plating thickness, biology and environment.*

Apex logo
Ca Se and K in a leaf

ATLAS Apex microEDXRF elemental maps of K, Ca, Se and sum of X-rays image of a hydrated youngest fully opened leaflet of
Neptunia amplexicaulis (CLICK to ENLARGE)

5 µm Resolution for High-Definition Elemental Mapping

Atlas Apex M is a benchtop microXRF spectrometer designed for high-resolution elemental mapping, hyperspectral XRF imaging, and quantitative micro-scale analysis. Its 5 µm X-ray spot enables detailed chemical imaging, allowing users to resolve fine features, identify localized elemental variations, and characterize complex materials with exceptional spatial accuracy.

This high-resolution capability is especially valuable for applications such as geological thin sections, mineral mapping, contamination analysis, coatings, semiconductors, and advanced materials research, where smaller beam sizes reveal finer elemental distributions, sharper phase boundaries, and subtle sample heterogeneity that larger spot sizes may miss.

5 vs 10 vs 20 microns

When it comes to XRF microscopic imaging (mapping), smaller is always better. Above is a geologic thin section comparing (left to right) a 5µm beam with a 10µm and 20µm beam respectively.

Superior Geometry

ATLAS Apex w/ 5 µm round spot

Perpendicular Geometry for Accurate Elemental Imaging

Atlas Apex M uses perpendicular microXRF geometry, with the X-ray beam directed normal to the sample surface. This geometry produces a circular excitation spot rather than an elongated elliptical footprint, helping preserve spatial accuracy during hyperspectral XRF mapping. The result is cleaner image fidelity, improved feature definition, and more reliable elemental distribution data across the sample surface.

High-Speed Mapping with Up to Four SDD Detectors

Atlas Apex M can be configured with up to four Silicon Drift Detectors, providing a large solid angle for efficient X-ray collection. This multi-detector architecture supports high count rates, improved throughput, and fast high-resolution mapping while maintaining excellent spectral performance. For laboratories that need to analyze large areas, compare many regions of interest, or process multiple sample types, this detector flexibility helps balance resolution, sensitivity, and speed.

Atlas Apex with 4 detectors

Mosaic Automation for Large-Area Sample Navigation

Mosaic automation

Atlas Apex M includes mosaic automation that stitches high-magnification overview camera images into a single large-area composite. This gives users a clear visual reference of the sample beyond the native camera field of view and makes it easier to define regions of interest for automated spot analysis, elemental mapping, and linescans. Integrated with Atlas Automation, mosaic imaging streamlines sample setup, navigation, and ROI selection.

Automated Spot Analysis, Mapping, and Linescans

spot automation

Atlas Apex M supports automated microXRF workflows for spot analysis, elemental mapping, and linescans. Users can define points, regions, or paths across a sample and collect spatially resolved XRF data with minimal manual intervention. These automated workflows improve productivity, repeatability, and confidence when analyzing complex or heterogeneous materials.

Iridium Ultra Software for MicroXRF Analysis

Atlas Apex M is powered by Iridium Ultra, IXRF’s in-house software platform for acquisition, automation, mapping, quantification, phase analysis, and reporting. The software is designed to be accessible for new users while providing advanced tools for experienced analysts, including custom report generation, microXRF phase analysis, particle analysis, morphology tools, quantitative mapping, and ASTM testing methods.

Intuitive Software
20260322_133847910_iOS
Thin Sections
Liquid Sampling

Flexible Sample Types and Analysis Conditions

Atlas Apex M is designed to analyze a wide range of sample types and conditions. The system supports solids, liquids, powders, particles, thin films, coatings, and irregular samples, with operation in air, vacuum, or helium atmosphere. Its large vacuum chamber improves light-element sensitivity and allows the system to be ready for vacuum analysis in under one minute.

Designed and Manufactured in the United States

Atlas Apex M is designed, manufactured, and supported by IXRF Systems in Austin, Texas. The instrument hardware, software, and application support are developed in-house, giving laboratories direct access to the expertise behind the system.

Made in U.S.A.

Micro X-ray Excitation

Atlas Apex M uses a 50 kV / 50 W Rh-target X-ray tube, with other target materials available depending on application requirements. The excitation system is paired with polycapillary focusing optics to deliver small, high-intensity primary X-ray spots for micro-scale elemental analysis.

Available primary X-ray spot sizes include 5, 10, 15, 20, 25, 40, and 100 µm, allowing users to balance spatial resolution, sensitivity, and throughput based on the sample and analytical goal. A filter wheel with up to seven filters plus an open position is positioned before the focusing optic, providing flexible beam conditioning for optimized excitation across different elements and materials.

Atlas Apex with 4 detectors

Silicon Drift Detector Configuration

Atlas Apex M can be configured with up to four (4) Silicon Drift Detectors for increased X-ray collection efficiency, improved precision, and reduced acquisition times. This flexible detector architecture allows laboratories to match detector area and configuration to their analytical priorities, whether the goal is trace element sensitivity, fast mapping, high spectral quality, or high-throughput sample analysis.

Detector options range from 30 mm² to 65 mm² and are arranged in close-coupled geometry to maximize solid angle collection efficiency. Each detector is Peltier thermoelectrically cooled and supports excellent spectral performance, with energy resolution down to ≤125 eV depending on detector configuration and operating conditions.

Chamber and Perpendicular Geometry

The Atlas Apex M chamber is designed to support a wide range of sample types and sizes while maintaining the geometry needed for accurate microXRF imaging. The chamber measures 508 × 457 × 254 mm, or 20 × 18 × 10 inches, and provides a large automated mapping area of 220 × 200 mm.

Atlas Apex M uses top-down perpendicular geometry, with the X-ray beam directed normal to the sample surface. This geometry helps maintain a circular excitation spot and supports accurate hyperspectral XRF imaging by reducing the spatial distortion associated with angled excitation geometries.

Three sample positioning and analysis cameras assist with navigation, region-of-interest selection, and sample alignment. Samples may also be positioned manually with the chamber door open, giving users additional flexibility during setup.

ATLAS Apex M

High-Precision Motorized Stages

Atlas Apex M includes motorized X, Y, and Z stages for automated spot analysis, linescans, and elemental mapping. The high-speed stage system supports movement speeds up to 300 mm/s, map acquisitions at ≤1 ms per pixel, and positioning accuracy below 1 µm.

This precision motion platform enables repeatable analysis of small features, large-area maps, multiple regions of interest, and complex sample layouts. Custom sample adapters are also available to support specialized workflows, unusual sample geometries, and application-specific mounting requirements.

Designed and Manufactured in the United States

Atlas Apex M is designed, manufactured, and supported by IXRF Systems in Austin, Texas. The instrument hardware, software, and application support are developed in-house, giving laboratories direct access to the engineering and analytical expertise behind the system.

Made in U.S.A.

Iridium Ultra™ for MicroXRF Mapping, Quantification, and Analysis

Atlas Apex M is powered by Iridium Ultra™, IXRF’s in-house microXRF software platform for Windows® 11. Designed for both new and advanced users, Iridium Ultra integrates acquisition, spectral processing, quantitative analysis, hyperspectral XRF mapping, phase classification, image analysis, and reporting into a single workflow.

With Iridium Ultra, every pixel in an XRF map contains a full energy dispersive X-ray fluorescence spectrum. This allows users to move beyond simple elemental images and interact directly with the spectral data behind each map, region, feature, particle, or line profile. Users can extract spectra from points, areas, or freehand regions; compare elemental distributions; generate quantitative maps; classify phases; and create application-ready reports from the same software environment.

User Interface

Acquisition and Quantitative Analysis

Iridium Ultra simplifies microXRF acquisition while providing the analytical depth required for complex materials characterization. Users can perform one-click acquisition, automatic peak identification, and quantitative analysis while retaining full control over processing, labeling, calibration, and reporting.

Key capabilities include:

  • Energy dispersive X-ray fluorescence software for microXRF and microEDXRF analysis
  • Fundamental Parameters analysis for solids, liquids, powders, and particles
  • Thin-film Fundamental Parameters analysis for up to 8 layers, including an infinite base or substrate
  • Up to 8 acquisition conditions per analysis
  • Automatic peak identification and customizable element labeling
  • Automatic overlap correction, background correction, sum peak treatment, escape peak treatment, and full spectral deconvolution
  • Empirical analysis using least squares and Lucas-Tooth methods
  • Quantitative Match and material classification database tools
  • Scrolling periodic table for fast element selection and spectral review
  • Drag-and-drop overlay tools for elemental image comparison
  • Custom report generation for documentation and data communication

Hyperspectral XRF Mapping and Imaging

Iridium Ultra enables high-resolution hyperspectral XRF mapping where each pixel stores a complete XRF spectrum. This makes it possible to visualize elemental distributions, quantify regions of interest, identify small features, and explore complex sample heterogeneity with high spatial and chemical detail.

Mapping and imaging capabilities include:

  • Hyperspectral EDXRF mapping and imaging up to 9,998 × 9,998 pixels
  • Full-spectrum data storage at every pixel
  • Simultaneous acquisition of up to 35 elements
  • Live spectrum display during acquisition
  • Single or multiple map acquisition from overview or spot camera images
  • Map stitching and montage for large-area elemental imaging
  • Point, area, and freehand spectrum extraction from maps
  • Linescan creation directly from map data
  • Mouse-over display of intensities and concentrations
  • Multi-compositional map display for elements, compounds, components, materials, and user-defined compositions
  • Elemental and compound range overlays
  • Linescan overlays on optical or elemental images

Intuitive Interface with Advanced Analytical Depth

Iridium Ultra is designed to be easy for new users to navigate while giving advanced analysts access to powerful microXRF tools without requiring separate software add-ons. Its top-menu navigation, one-click acquisition tools, spectral displays, image overlays, and automated reporting features help users move efficiently from sample setup to final results.

User interface features include:

  • Top-menu navigation
  • One-click acquisition, peak identification, and quantification
  • Spectral display with up to 25 individual spectrum windows
  • Point-and-click cursor display of energy, counts, and possible elements
  • Customizable automatic element identification and peak labeling
  • Scrolling element markers from the periodic table
  • Complete spectrum annotation tools, including customizable text and lines
  • Drag-and-drop overlays for rapid elemental image comparison
  • Standard inclusion of advanced tools without additional software options
Imaging Mapping Flow
Intuitive Software
Mosiac-overview camera

Mosaic Navigation and Optical Imaging

Iridium Ultra includes high-resolution optical imaging tools that support sample navigation, region selection, and correlation between optical features and XRF data. Mosaic navigation stitches high-magnification overview images into a single large-area composite, giving users a clear visual reference for defining analytical regions across the sample.

Mosaic and optical imaging tools include:

  • Ultra-high-definition optical mosaic imaging up to 100 megapixels
  • User-configurable mosaic resolution, limited by storage capacity and stitching parameters
  • High-magnification image stitching and montage from the overview camera
  • Full-sample visualization beyond the native 13 × 10 mm camera field of view
  • Multi-point automated analysis directly from the image
  • Motorized zoom and focus control through software
  • Live imaging during stage movement
  • Adjustable LED illumination
  • Integrated crosshair overlay for accurate alignment of analysis points and mapping areas
  • Imaging field of view matched to X-ray spot size for accurate optical-to-XRF correlation
  • Streamlined ROI definition through integration with Atlas Automation

Phase Analysis and Mineral Identification

For geological and materials research, Iridium Ultra includes advanced tools for phase analysis, mineral identification, and compositional classification. Principal Component Analysis can be applied to intensity-based or concentration-based maps to help identify chemically distinct regions and visualize phase distributions across the field of view.

Phase and mineral analysis capabilities include:

  • Principal Component Analysis for exploratory phase mapping
  • PCA analysis using intensity maps or concentration maps
  • Color-coded phase maps for visual classification
  • Percent field-of-view calculation for each identified phase
  • Multi-compositional map display for elements, compounds, and materials
  • IU-GEOCHEM: Geological Elemental Observation and Characterization of High-Efficiency Mapping
  • Mineral identification supported by a comprehensive database of approximately 4,000 minerals
  • Fast classification of mineral phases from hyperspectral microXRF data

Imaging composition

  • User-defined compositions define the image
  • Maps can be defined by intensities or concentrations
  • Maps can be elements, compounds, components, materials, etc.

Line Profile Analysis

Iridium Ultra supports detailed line profile analysis for evaluating relative elemental intensity or concentration changes across a defined path. Linescans can be used to investigate interfaces, coatings, diffusion zones, compositional gradients, phase boundaries, and long-distance elemental variation.

Linescan capabilities include:

  • Relative elemental concentration or intensity along a selected line
  • Separate display of each element for clear trend analysis
  • Tiled or stacked chart views for comparison
  • Overlay of linescan data on optical or elemental images
  • Support for long linescans across large sample areas
  • High-resolution analysis of ppm-level features, depending on sample, configuration, and acquisition conditions
Mosaic automation

Particle Analysis, Morphology, and Feature Classification

Iridium Ultra includes morphology and particle analysis tools that allow users to identify, count, measure, classify, and evaluate features based on both image characteristics and elemental composition. This is especially useful for particles, inclusions, contamination, defects, and other discrete features in complex samples.

Morphology and particle analysis tools include:

  • Segmentation and feature segregation
  • Particle analysis package with border removal, sorting, and exclusion
  • Classification by composition
  • Rapid feature size measurements
  • Elemental identification of particles, inclusions, and surface features
  • Automated counting and measurement by feature type
  • Additional data collection from selected features
  • Extensive image analysis tools adapted from advanced microscopy workflows

Developed In-House in Austin, Texas

Iridium Ultra is written and supported in-house by IXRF Systems in Austin, Texas. Because the hardware, software, and application support are developed together, Atlas Apex M users benefit from an integrated microXRF platform designed for practical laboratory workflows, advanced elemental mapping, and long-term analytical flexibility.

Made in U.S.A.

Atlas Apex M features

Atlas Apex M delivers high-performance microXRF analysis in a compact benchtop platform. Designed for high-resolution elemental mapping, hyperspectral XRF imaging, and quantitative micro-scale analysis, it combines a 50 kV / 50 W polycapillary X-ray source, spot sizes down to 5 µm, configurable SDD detectors, and a large sample chamber for flexible laboratory workflows.

Key features include:

  • Benchtop / tabletop microXRF spectrometer design
  • X-ray spot size down to 5 µm with anti-halo optic
  • SDD detector configurations with active areas up to 65 mm²
  • Large chamber volume for diverse sample types
  • Multi-point, multi-area, mapping, and linescan automation
  • Air, vacuum, or helium operation for solids, liquids, powders, particles, thin films, and coatings
  • Iridium Ultra software running on Windows® 11 for acquisition, mapping, quantification, phase analysis, and reporting

Specifications

Specifications

Elemental range:

Fluorine (F) through Americium (Am). Carbon (C) through Americium (Am) on the LE version of Atlas

Sample types:

Solids, liquids, particles, powders and thin films

Sample chamber size:

508 x 457 x 254 mm (20 x 18 x 10 inches)

Analysis atmosphere:

Air, vacuum or He(g) purge

Primary X-ray source:

50 W max power, 50 kV @ 1 mA

Optional secondary X-ray source:

4-12 W max power,  40-60 kV @ 0.4-1 mA

X-ray source optics:

Polycapillary or aperture collimation

X-ray source anode:

Rhodium (others optionally available)

X-ray source spot size (primary):

5 μm standard (optional: 10, 15, 20, 25, 40 or 100 μm)

X-ray source filters:

Up to 7 plus an open position

Primary X-ray source geometry:

Top-down beam (perpendicular to sample stage)

Detector(s):

1 standard, optionally up to a maximum of 4

Detector types:

Silicon drift detector (SDD) with Graphine windows

Detector active area:

30 to 65 mm2, up to 260 mm2 w/ 4 detectors

Sample stage type:

Motorized X, Y, and Z

Sample stage travel:

320(W) x 320(D) x 210(H) mm

Mapping travel:

220(X) x 200(Y) mm

Mapping scan speed:

1-3 ms/pixel

Stage XY speed:

Up to 300 mm/s

Sample view:

3 cameras for sample positioning and analysis

Operating system:

SFF PC w/ Microsoft® Windows™ 11 OS

Analysis and control software:

Iridium Ultra: provides complete control of parameters, filters, cameras, optical microscopes, sample illumination and positioning, and measurement media

Quality and safety:

CE marked, RoHS, radiation < 0.5 μSv/h

Dimensions:

890(L) x 560(W) x 560(H) mm (35 x 22 x 22 inches)

Power:

100-240 V, 1 phase, 50/60 Hz

Periodic table

  • Quantify elements from carbon (C) through uranium (U)
  • In any sample type: solids, liquids, powders, particles, and thin films
  • From low parts-per-million (PPM) to 100 wt.%
  • Hyperspectral microscopic imaging
    • where every pixel is a complete spectrum
  • Mapping, linescans, multi-poin,t and single-point quantification
Periodic Table of the Elements
phtonmining

Phytomining / agromining

  • Elemental mapping of hydrated plant tissue
    • From heavy metals to REEs
  • Identify and quantify hyper-accumulation
  • In situ analysis ready, with feedthroughs that enable other measurement modalities

Life sciences

  • Hyperspectral XRF microscopy
  • From anatomy to biology to botany and beyond
  • 100% Nondestructive
  • Unlike a SEM, there is no coating or sample prep
  • Works with non-conductive samples
  • Automatically produce quantitative analysis for each pixel
forensics for paint

Forensics for paint chips

  • Very powerful forensic  tool capable of single or multi-spot analysis
  • Hyperspectral XRF microscopic elemental quantitative imaging
    • To identify distribution of elements within a sample
    • Paint chip and paint layer analysis is a common forensic application
  • Differentiate closely related samples
    • By the coating, paint, or base coat in any combination

Circuit board inspection

  • Fast X-ray mapping for electronics’ inspections
  • A complete X-ray Spectrum for each pixel in the map
  • Measure thin gold and palladium coatings on PCBs
  • Measure coating thickness of Cu, Ni, etc.
  • Measure solder composition
  • RoHS / WEEE compliance
lead frame imaging

Lead frame imaging

  • Measurements on very small flat components and structures such as conducting paths, contacts or lead frames
  • Measurements of typical multi-coating systems on lead frames,e.g., AuAg/Pd/Ni/CuFe or Au/Pd/Ni/CuFe in the nanometer range
  • Determination of the phosphorous content in NiP coatings
  • Measurements of functional coatings in the electronics and semiconductor industries
  • Determination of complex multi-coating systems

Wafer metrology

  • Sn/Ag Bump/Pillar measurements
  • Light elements
  • Metal film stack composition such as CIGS
  • Cu CMP control at BEOL
  • Multi-stack structures
  • Sputtering targets
  • Thermal barrier coating
  • Thickness and composition control
wafer mapping
pharmaceuticals

Pharmaceuticals

  • Trace XRF spectrometry mapping at 5 microns
  • Trace analysis of metal impurities and inclusions
  • Non-destructive elemental analysis
  • Quality control / quality assurance
  • Particle analysis
  • Distribution and/or phase analysis

Soils and drilling cores

  • Quick phase maps using Principal Components Analysis (PCA)
  • Map samples automatically in minutes
  • No sample preparation
  • Mineral identification capabilities (including a library of over 4000 minerals)
  • Phase boundaries
metal inclusions

Metals & alloys

  • Advanced continuously cast high strength low alloy steels are often subject to elemental segregation along the billet or slab centerline
    • Rapidly scan centerline areas and quantitatively monitor elemental inhomogeneity
  • Of particular interest is manganese (Mn) which is the primary hardening agent that can easily be measured in an air environment
    • Other segregating elements of interest include: Cr, Ni, Mo, S, P, Al and Si

Geology

  • Small spot, microEDXRF expands the abilities of a geologist. Micro-XRF is ideally suited for the analysis of inorganic species, and offers excellent sensitivity to trace elements and phases
  • Point analysis allows fast identification of mineral phases, even when analyzing individual grains from crushed rock, or microscopic features in a section
  • XRF hyperspectral imaging provides detailed element images which highlight the distribution of mineral phases, illustrating the general rock structure
• Geological thin slices
• Mineral identification
• Phase boundaries 		• Meteorites
• Volcanic material
• Sediment cores 		• Mining test cores
• Mining exploration
• Gemstones
geological

Cement & aggregate

  • Elemental mapping of concrete and cements may be performed with ATLAS Apex providing the analyst with the opportunity to visually and chemically inspect the physical sample
  • XRF is the established technique to control the quality and conformity of the final cement product
  • Phase mapping of concrete cores provides quantitative aggregate distribution data

RoHS / WEEE

  • With stage mapping, large samples can be quickly mapped for the identification of prohibited materials
  • It is not necessary to know what elements are present before collecting a map
  • Elements can be added as the spectrum grows and peaks become evident
  • The Atlas Apex M offers one of the largest sample chambers in the industry

Archaeometry

  • Sensitive and valuable archaeological objects can be easily and reliably analyzed with the ATLAS Apex microXRF spectrometer
  • The microEDXRF (μXRF) technique permits a fast non-destructive analysis of objects, especially on small sample areas
  • Atlas Apex M allows low-Z elements of large objects to be analyzed

CIGS solar cells

  • Analysis of thin film photovoltaic cells is commonly performed with microXRF
  • With ATLAS Apex, it is possible to measure structures under vacuum for superior results
  • For in-line control during the production process as well as for final testing
  • Quantification for layer thicknesses are in very good agreement with WDXRF results
CIGS solar cell
Made in U.S.A.

Made in United States

  • Designed in the USA
  • Manufactured in Austin, Texas
  • Software is written in-house in Austin

Reference documents

      • “Company Index: A Guide to Companies.” Microscopy Today 21, no. S1 (March 2013): 50–55. https://doi.org/10.1017/S1551929513000357.
      • Do, Christina, Farida Abubakari, Amelia Corzo Remigio, Gillian K. Brown, Lachlan W. Casey, Valérie Burtet-Sarramegna, Vidiro Gei, Peter D. Erskine, and Antony van der Ent. “A Preliminary Survey of Nickel, Manganese and Zinc (Hyper)Accumulation in the Flora of Papua New Guinea from Herbarium X-Ray Fluorescence Scanning.” Chemoecology 30, no. 1 (February 1, 2020): 1–13. https://doi.org/10.1007/s00049-019-00293-1.
      • Ent, Antony van der, Peter M. Kopittke, David J. Paterson, Lachlan W. Casey, and Philip Nti Nkrumah. “Distribution of Aluminium in Hydrated Leaves of Tea ( Camellia Sinensis ) Using Synchrotron- and Laboratory-Based X-Ray Fluorescence Microscopy.” Metallomics 12, no. 7 (2020): 1062–69. https://doi.org/10.1039/C9MT00300B.
      • Harvey, Maggie-Anne, Erskine, Peter D., Harris, Hugh H., Brown, Gillian K., Pilon-Smits, Elizabeth A. H., Casey, Lachlan W., Echevarria, Guillaume and van der Ent, Antony (2020). Distribution and chemical form of selenium in Neptunia amplexicaulis from Central Queensland, Australia. Metallomics 12 (4) 514-527. https://doi.org/10.1039/c9mt00244h.
      • Van der Ent, Antony, Casey, Lachlan W., Blamey, F. Pax C. and Kopittke, Peter M. (2020). Time-resolved laboratory µ-XRF reveals silicon distribution in relation to manganese toxicity in soybean and sunflower. Annals of Botany. https://doi.org/10.1093/aob/mcaa081.
      • Huang, Xitong, Yong Li, Ke Chen, Haiyan Chen, Fei Wang, Xiaomin Han, Beihai Zhou, Huilun Chen, and Rongfang Yuan. “NOM Mitigates the Phytotoxicity of AgNPs by Regulating Rice Physiology, Root Cell Wall Components and Root Morphology.” Environmental Pollution 260 (May 2020): 113942. https://doi.org/10.1016/j.envpol.2020.113942.
      • Jones, Michael W. M., Peter M. Kopittke, Lachlan Casey, Juliane Reinhardt, F. Pax C. Blamey, and Antony van der Ent. “Assessing Radiation Dose Limits for X-Ray Fluorescence Microscopy Analysis of Plant Specimens.” Annals of Botany 125, no. 4 (March 29, 2020): 599–610. https://doi.org/10.1093/aob/mcz195.
      • Le Pape, Y. “Neutron-Irradiation-Induced Damage Assessment in Concrete Using Combined Phase Characterization and Nonlinear Fast Fourier Transform Simulation.” In Proceedings of the 10th International Conference on Fracture Mechanics of Concrete and Concrete Structures. IA-FraMCoS, 2019. https://doi.org/10.21012/FC10.232765.
      • Li, Y., Y. Le Pape, E. Tajuelo Rodriguez, C.E. Torrence, J.D. Arregui Mena, T.M. Rosseel, and M. Sircar. “Microstructural Characterization and Assessment of Mechanical Properties of Concrete Based on Combined Elemental Analysis Techniques and Fast-Fourier Transform-Based Simulations.” Construction and Building Materials 257 (October 2020): 119500. https://doi.org/10.1016/j.conbuildmat.2020.119500.
      • Pearson, Charlotte, Matthew Salzer, Lukas Wacker, Peter Brewer, Adam Sookdeo, and Peter Kuniholm. “Securing Timelines in the Ancient Mediterranean Using Multiproxy Annual Tree-Ring Data.” Proceedings of the National Academy of Sciences 117, no. 15 (April 14, 2020): 8410–15. https://doi.org/10.1073/pnas.1917445117.
      • Ye, Hui, Changzhi Wu, Matthew J. Brzozowski, Tao Yang, Xiangping Zha, Shugao Zhao, Bingfei Gao, and Weiqiang Li. “Calibrating Equilibrium Fe Isotope Fractionation Factors between Magnetite, Garnet, Amphibole, and Biotite.” Geochimica et Cosmochimica Acta 271 (February 2020): 78–95. https://doi.org/10.1016/j.gca.2019.12.014.
      • Zhang, Mingyuan, Jianxiang Wang, and Li-Hua Shao. “Ultrahigh Flexoelectricity of 3D Interconnected Porous PDMS.” ArXiv:2009.03847 [Physics], September 27, 2020. http://arxiv.org/abs/2009.03847.
      • Ziejewska, Celina, Joanna Marczyk, Aneta Szewczyk-Nykiel, Marek Nykiel, and Marek Hebda. “Influence of Size and Volume Share of WC Particles on the Properties of Sintered Metal Matrix Composites.” Advanced Powder Technology 30, no. 4 (April 1, 2019): 835–42. https://doi.org/10.1016/j.apt.2019.01.013.

Search terms

  • XRF
  • X-ray fluorescence
  • X-ray fluorescence spectroscopy
  • X-ray fluorescence spectrometry
  • energy dispersive X-ray fluorescence
  • energy dispersive X-ray fluorescence spectroscopy
  • energy dispersive X-ray fluorescence spectrometry
  • micro X-ray fluorescence
  • micro X-ray fluorescence spectroscopy
  • micro X-ray fluorescence spectrometry
  • micro energy dispersive X-ray fluorescence
  • micro energy dispersive X-ray fluorescence spectroscopy
  • micro energy dispersive X-ray fluorescence spectrometry
  • μXRF
  • mXRF
  • μEDXRF
  • mEDXRF
  • microXRF
  • microEDXRF
  • micro-XRF
  • m-XRF
  • micro-EDXRF
  • m-EDXRF
  • small spot XRF
  • small-spot XRF
  • small spot EDXRF
  • small-spot EDXRF

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