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Over the past three decades, IXRF has been designing and manufacturing high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM). Almost 10 years ago, IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. In 2014, IXRF launched our ATLAS series of general purpose, micro spot energy dispersive X-ray fluorescence (microEDXRF) spectrometers for the measurement and mapping of elements from sodium (Na) through uranium (U).

IXRF, Inc. is an EEO/AA employer. Qualified applicants for jobs will receive consideration for employment without regard to race, color, religion, sex, national origin, sexual orientation, gender identity, disability or protected veteran status. Applicants must be able to prove they can legally work in the US.