Contact us

Talk to a Representative

512.386.6100

Get in touch

*required fields
IXRF, Inc.
10421 Old Manchaca Rd., Suite 620
Austin, TX 78748
P: 512.386.6100
F: 512.386.6105
info@IXRFsystems.com


Over the past two decades, IXRF has been designing and manufacturing high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM). Almost 10 years ago, IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. In 2014, IXRF launched our ATLAS series of general purpose, micro spot energy dispersive X-ray fluorescence (microEDXRF) spectrometers for the measurement and mapping of elements from sodium (Na) through uranium (U).