IXRF Systems Microanalysis & microXRF
Analytical Instrumentation Iridium Ultra Software
Leading Microanalysis Innovation SEM/EDS | SEM/EDX Energy Dispersive X-ray
Fluorescence Spectrometry
for Electron Microscopy New Systems & Upgrades ATLAS M Benchtop microXRF Micro-spot Energy Dispersive
X-ray Fluorescence Spectrometry SEM-XRF Integrated e-Beam / X-ray Beam X-ray Sources for
Electron Microscopy ATLAS X microXRF Ultimate Micro-spot Hyperspectral
XRF Imaging Spectrometer System

∙ Up to 600 mm² SDD for fast maps

∙ 5 um spot size for highest spatial resolution

∙ Largest chamber with 300 x 400 mm mapping

∙ Perpendicular tube geometry for round pixels

∙ Easy-to-use Iridium Ultra software w/ automation

Our Products

IXRF designs and manufactures high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM/EDS). IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. Additionally IXRF offers the ATLAS series of general purpose, microXRF energy dispersive X-ray fluorescence (microXRF) spectrometers for elemental analysis and hyperspectral imaging of elements from carbon (C) through uranium (U). We specialize in: SEM/EDS, SEM-XRF and microXRF.
Made in U.S.A.

micro-XRF

Imaging microXRF Spectrometers

The ATLAS series of micro-XRF microscopic hyperspectral imaging spectrometers are the latest general-purpose micro X-ray spot energy dispersive X-ray fluorescence (EDXRF) instruments for the measurement and mapping of elements from sodium (Na) through uranium (U).

Designed to image and analyze a wide variety of sample types, ATLAS leads the industry in virtually every major specification category, from the most powerful software  (Iridium Ultra) and the largest detector active area to our superior perpendicular geometry and smallest micro-spot.

Microanalysis

SEM/EDS — SEM-XRF — SDD

SEM/EDS:  For scanning electron microscopes (SEM), we offer a complete EDS (EDX) system: software,  SDD detectors, digital signal processors, and software. Our Windows®-10 based EDS software – Iridium Ultra – delivers all-inclusive functionality.

SEM-XRF:  IXRF’s Xb micro-spot X-ray source adds the capabilities of a complete micro X-ray fluorescence (microXRF) spectrometer to any scanning electron microscope (SEM). μXRF users benefit from non-destructive measurements, superior trace element sensitivity, and broader elemental coverage (Na through U).

Recent Articles

Sage Brush Analysis MicroXRF

​​​Analyzing Sage Brush Using MicroXRF: A Deep Dive into Botanical Research​

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At IXRF Systems, we are committed to making a difference in scientific research and industrial processes. The role of X-ray fluorescence (XRF) technology cannot be understated when it comes to…

Chemical Changes in Fall Leaves and the Role of MicroXRF in Analysis

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As the hues of trees transition from green to gold, crimson, and tangerine during the fall season, a symphony of chemical changes occurs within their leaves. This natural spectacle, celebrated…

The Secret Stories Your Hair Can Tell: Unraveling Mysteries through Forensic Analysis

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Written by Mandi Hellested, Chief Technology Officer Imagine a poolside scene: sparkling water, laughter, and the distinctive scent of chlorine in the air. It's not just a refreshing dip; it's…

The Importance of Rubber Tire Criminal Forensic Analysis and the Role of microXRF

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Tire marks, skid marks, and tire fragments often serve as critical pieces of evidence in criminal investigations, especially those involving vehicular incidents. From hit-and-run cases to suspicious activities off the…

Boosting Integrated Circuit Quality: How High Spatial Resolution MicroXRF Revolutionizes Packaging

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When incorporating IXRF System's Atlas microXRF with its high spatial resolution and spot size as small as 5 microns, the advantages of using microXRF for quality control in Quad Flat…

Is MicroXRF Technology the Missing Link in Standard Metallurgical and Failure Analysis of Ferrous-Based Components?

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Written by Ben Ruchte, P.E., Director of Product Engagement The pursuit of precision and the quest for deeper insights have been constants in ferrous-based components' metallurgy and failure analysis. Traditional methods…
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ATLAS M

IXRF Systems specializes in micro-spot X-ray fluorescence (XRF) spectrometers employing energy dispersive detectors (EDXRF). XRF is an X-ray spectrometric technique for elemental analysis of a wide variety of materials. Other phrases for XRF instruments include: microXRF, microEDXRF, micro-XRF, micro-EDXRF, μXRF, μEDXRF, micro XRF, energy dispersive X-ray spectrometry, energy dispersive spectrometry (EDS or EDX), X-ray spectroscopy, energy dispersive X-ray spectroscopy, XRF analyzer, XRF spectrometer, XRF analysis, X-ray fluorescence analyzer, x-ray fluorescence spectrometry, fluorescence x, spectromètre de fluorescence X, Röntgenfluoreszenzanalyse, fluorescencia de rayos X, Röntgenfluoreszenz, Röntgenfluorescentie, Röntgenfluorescens, Röntgenfluoresenssi, Røntgenfluorescens and Promieniowanie rentgenowskie.

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HAVE QUESTIONS?

FAQs

What type of EDS detectors does IXRF offer?

IXRF offers a multitude of different X-ray detectors. You may choose from several different guaranteed resolutions.

I am interested in an upgrade. Can I use my existing EDS detector?

Yes, IXRF was designed to interface with most detectors. We have not come across one which was incompatible. In many cases light element sensitivity is increased due to our digital pulse processing electronics.

When I upgrade my IXRF software, what needs to be done?

Simply download the latest version and install it.

Once I buy an IXRF system and later decide to change to a different SEM, can the IXRF system be adapted to a different SEM?

It the majority of situations, yes the detector can be fitted to be moved to the new SEM. Please contact IXRF at the beginning of your planning so that we can verify if your detector can work for the SEM you are considering purchasing.

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