IXRF Systems Microanalysis & microXRF
Analytical Instrumentation Iridium Ultra Software
Leading Microanalysis Innovation SEM/EDS | SEM/EDX Energy Dispersive X-ray
Fluorescence Spectrometry
for Electron Microscopy New Systems & Upgrades ATLAS M Benchtop microXRF Micro-spot Energy Dispersive
X-ray Fluorescence Spectrometry SEM-XRF Integrated e-Beam / X-ray Beam X-ray Sources for
Electron Microscopy ATLAS X microXRF Ultimate Micro-spot Hyperspectral
XRF Imaging Spectrometer System

∙ Up to 280 mm² SDD for fast maps

∙ 5 um spot size for highest spatial resolution

∙ Largest chamber with 300 x 400 mm mapping

∙ Perpendicular tube geometry for round pixels

∙ Easy-to-use Iridium Ultra software w/ automation

Our Products

IXRF designs and manufactures high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM/EDS). IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. Additionally IXRF offers the ATLAS series of general purpose, microXRF energy dispersive X-ray fluorescence (microXRF) spectrometers for elemental analysis and hyperspectral imaging of elements from carbon (C) through uranium (U). We specialize in: SEM/EDS, SEM-XRF and microXRF.
Made in U.S.A.

micro-XRF

Imaging microXRF Spectrometers

The ATLAS series of micro-XRF microscopic hyperspectral imaging spectrometers are the latest general purpose micro X-ray spot energy dispersive X-ray fluorescence (EDXRF) instruments for the measurement and mapping of elements from sodium (Na) through uranium (U).

Designed to image and analyze a wide variety of sample types, ATLAS leads the industry in virtually every major specification category from the most powerful software  (Iridium Ultra) and the largest detector active area, to our superior perpendicular geometry and smallest micro-spot.

Microanalysis

SEM/EDS — SEM-XRF — SDD

SEM/EDS:  For scanning electron microscopes (SEM), we offer a complete EDS (EDX) system: software,  SDD detectors, digital signal processor and software. Our Windows®-10 based EDS software – Iridium Ultra – delivers all-inclusive  functionality.

SEM-XRF:  IXRF’s Xb micro-spot X-ray source adds the capabilities of a complete micro X-ray fluorescence (microXRF) spectrometer to any scanning electron microscope (SEM). μXRF users benefit from non-destructive measurements, superior trace element sensitivity and broader elemental coverage (Na through U) .

Recent Articles

Understanding Multi-Layer Thin Film Analysis Using MicroXRF

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Accurate characterization of multi-layer thin films is a critical aspect of materials science and engineering. IXRF Systems' ATLAS micro-scale X-ray Fluorescence (microXRF) spectrometer provides a practical tool for analyzing film…

Enhancing Geological Insights with MicroXRF Equipped with New Advanced Detector

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Geological research demands precision, accuracy, and sensitivity—especially when exploring complex materials composed of low atomic number (low-Z) elements. At IXRF Systems, our latest innovation, the XR (Extended Range) Silicon Drift…

Looking for Traces of Ancient Life: Harvard University’s MicroXRF Analysis of Silica Crusts from South Africa

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At IXRF Systems, we are always excited to see how our microXRF technology contributes to groundbreaking research. Recently, researchers from Harvard University, led by graduate student David Madrigal-Trejo, using Harvard’s…

Introducing the IXRF Systems Podcast – MicroXRF Insights On the Go!

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We’re thrilled to introduce the brand-new IXRF Systems Podcast – your go-to source for deep dives into the world of MicroXRF! Whether you're a scientist, researcher, or industry professional, our…

FAQ – How microXRF and Fundamental Parameters Unlock Material Quantification

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In materials analysis, the challenge isn’t just identifying what’s there—it’s figuring out how much is there. That’s where micro X-ray Fluorescence (microXRF) shines, leveraging the power of Fundamental Parameters (FP)…

Improving Concrete Analysis: How the Atlas X MicroXRF Enhances Durability, Chloride Detection, and ASR Studies

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Concrete is one of the most widely used construction materials, essential in everything from residential buildings to massive infrastructure projects. However, ensuring its longevity and integrity requires detailed chemical analysis—particularly…
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ATLAS M

IXRF Systems specializes in micro-spot X-ray fluorescence (XRF) spectrometers employing energy dispersive detectors (EDXRF). XRF is an X-ray spectrometric technique for elemental analysis of a wide variety of materials. Other phrases for XRF instruments include: microXRF, microEDXRF, micro-XRF, micro-EDXRF, μXRF, μEDXRF, micro XRF, energy dispersive X-ray spectrometry, energy dispersive spectrometry (EDS or EDX), X-ray spectroscopy, energy dispersive X-ray spectroscopy, XRF analyzer, XRF spectrometer, XRF analysis, X-ray fluorescence analyzer, x-ray fluorescence spectrometry, fluorescence x, spectromètre de fluorescence X, Röntgenfluoreszenzanalyse, fluorescencia de rayos X, Röntgenfluoreszenz, Röntgenfluorescentie, Röntgenfluorescens, Röntgenfluoresenssi, Røntgenfluorescens and Promieniowanie rentgenowskie.

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HAVE QUESTIONS?

FAQs

What type of EDS detectors does IXRF offer?

IXRF offers a multitude of different X-ray detectors. You may choose from several different guaranteed resolutions.

I am interested in an upgrade. Can I use my existing EDS detector?

Yes, IXRF was designed to interface with most detectors. We have not come across one which was incompatible. In many cases light element sensitivity is increased due to our digital pulse processing electronics.

When I upgrade my IXRF software, what needs to be done?

Simply download the latest version and install it.

Once I buy an IXRF system and later decide to change to a different SEM, can the IXRF system be adapted to a different SEM?

It the majority of situations, yes the detector can be fitted to be moved to the new SEM. Please contact IXRF at the beginning of your planning so that we can verify if your detector can work for the SEM you are considering purchasing.

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