IXRF designs and manufactures high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM/EDS). IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. Additionally IXRF offers the ATLAS series of general purpose, microXRF energy dispersive X-ray fluorescence (microXRF) spectrometers for elemental analysis and hyperspectral imaging of elements from carbon (C) through uranium (U). We specialize in: SEM/EDS, SEM-XRF and microXRF.
IXRF is led by a team of scientists and engineers with collective experience of over 75 years.
We have a dedicated team including staff, partners, and consultants with extensive experience in x-ray, mechanical, and electrical engineering.
We will customize our software for you. IXRF has written countless custom features / applications and integrated numerous different hardware components across many platforms.
With an extensive supply chain network, from machining and prototyping to manufacturing and final assembly, IXRF Systems can supply all of your microanalysis needs.
Archeology
Museum artifacts and currency
Metals and alloys
Gemstone inclusions
Painting authenticity/dating
Paints, inks, pigments
Corrosion products
Biomedical devices/implants
Solar cells
Optical filters
Manufacturing
Pathology
Pharmaceuticals
Semiconductor
RoHS, WEEE, and ELV compliance
Environmental analysis
Lead contamination in consumer goods
Soil contamination
Material characterization for recycling
Marine/ocean sediments
Airborne particles/air filters
Slurries
Forensic science
Glass chips
Paint cross sections
Inks & pigments
Soils & stones
Gun shot residue
Material identification
Geological
Meteorites
Phase boundaries
Mineral identification
Mining test cores
Electronics
Glasses
Building materials (concrete, cement)
Packaging
Medicine & biology
Bones & tissues
Leaves & plants
Implants
Particle analysis
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