Over the past three decades, IXRF has been designing and manufacturing high-end X-ray Microanalysis systems that are fitted to Scanning Electron Microscopes (SEM). Almost 10 years ago, IXRF developed SEM-XRF microscope attachments allowing broader elemental analysis coverage. In 2014, IXRF launched our ATLAS series of general purpose, micro spot energy dispersive X-ray fluorescence (microEDXRF) spectrometers for the measurement and mapping of elements from sodium (Na) through uranium (U).
For Almost Three Decades,
IXRF Has Distinguished Itself as an
Innovator in X-Ray Microanalysis
Company Timeline
1993
Los Alamos National Lab receives the first IXRF system.
1997
IXRF completes the First 100% integrated EDS Microanalysis system in the industry (developed for LEO/ZEISS Electron Microscopy).
2000
IXRF completes the Second fully integrated EDS system, this time for JEOL Ltd product line.
2002
IXRF designs and mounts the first XRF source on a scanning electron microscope (SEM).
2003
IXRF completes Third fully integrated EDS system for TESCAN Digital Microscopy
2005
IXRF introduces 10-40 micron X-ray maps configured for automated particle analysis.
2009
IXRF integrates precision piezo stages within a SEM. Piezo drives do not generate magnetic fields and are not influenced by them.
2011
Techcomp (Holdings)Ltd announced that the group had made a significant investment in IXRF Systems, Inc.
2013
IXRF Systems implements automatic ASTM E2926 software application for forensic glass using microEDXRF.
2014
The Atlas™ microEDXRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation.
Our Products
Core Competencies
XRF Spectrometry
Elemental Analysis
IXRF has been in the XRF and elemental analysis industry for over 25 years. Its founding partners have more than 50 years of tenure in the field.
Hardware Design
We have a dedicated team including staff, partners, and consultants with extensive experience in x-ray, mechanical, and electrical engineering.
Software
We will customize our software for you. IXRF has written countless custom features / applications and integrated numerous different hardware components across many platforms.
Supply Chain
With an extensive supply chain network, from machining and prototyping to manufacturing and final assembly, IXRF Systems can supply all of your microanalysis needs.
Sample Applications
Archeology
Museum artifacts and currency
Metals and alloys
Gemstone inclusions
Painting authenticity/dating
Paints, inks, pigments
Corrosion products
Biomedical devices/implants
Solar cells
Optical filters
Manufacturing
Pathology
Pharmaceuticals
Semiconductor
RoHS, WEEE, and ELV compliance
Environmental analysis
Lead contamination in consumer goods
Soil contamination
Material characterization for recycling
Marine/ocean sediments
Airborne particles/air filters
Slurries
Forensic science
Glass chips
Paint cross sections
Inks & pigments
Soils & stones
Gun shot residue
Material identification
Geological
Meteorites
Phase boundaries
Mineral identification
Mining test cores
Electronics
Glasses
Building materials (concrete, cement)
Packaging
Medicine & biology
Bones & tissues
Leaves & plants
Implants
Particle analysis
