IXRF customers never pay for software upgrades! It’s our thanks for analyzing with us. New feature developments are made available, at no cost, for existing primary customers for the life of their system. We have carried our customers through Windows 3.11, 2000, NT, XP, Vista, and now Windows 7/8/10 at no additional charge to anyone in any country!
microXRF X-ray sources for Scanning Electron Microscopes (SEM): addition of an polycapillary X-ray tube and Iridium Ultra software will transform your SEM’s quantitative analytical capabilities. Higher peak to background ratios enable greater elemental sensitivity for higher Z elements: sensitivity exceeding e–-beam excitation by a factor of 10-1000X.
Development of the Silicon Drift Detector for Electron Microscopy Applications. Lothar Strüder, Adrian Niculae, Peter Holl and Heike Soltau. Microscopy Today, Volume 28, Issue 5: September 2020 , pp. 46-53. DOI: https://doi.org/10.1017/S1551929520001327
In the 50 years since the first mating of semiconductor-based energy-dispersive X-ray spectrometry (EDS) with the scanning electron microscope (SEM), this hybrid instrument has become an indispensable microanalytical tool. In the last two decades a new detector, the silicon drift detector (SDD), has overtaken earlier Si(Li) technology and has made EDS in the SEM and TEM faster and better. This article tells the story of the SDD development and describes improvements in count rate capability, energy resolution, and detector geometry that bring to SEM microanalysis exceptional precision and stability. Quality maps of element distributions can now be obtained in minutes instead of hours.
Museum artifacts and currency
Metals and alloys
Paints, inks, pigments
RoHS, WEEE, and ELV compliance
Mining test cores
Building materials (concrete, cement)
Lead contamination in consumer goods
Material characterization for recycling
Airborne particles/air filters
Paint cross sections
Gun shot residue