Reflects the number of the electrons in the primary beam of the electron microscope. The number of electrons in the primary electron beam is directly proportional to the number of X-rays generated from the sample and the number of X-ray counts (intensities) recorded in the X-ray spectrum. Increasing the beam current will increase the number of X-rays generated from the sample but will not change the relative heights (intensities) of the Characteristic X-ray peaks in the spectrum

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