Benchtop MacroXRF for Labs Where Floor Space Is Limited
Atlas Veritas M brings real 2D elemental mapping, at a scale larger than microXRF typically handles, into a benchtop footprint. Full macroXRF analytical capability without the space commitment of a large-area floor system.
- Samples analyzed per day
- 20 → 500+
- Preserves high-value samples
- Non-destructive
- Samples per well tray
- 240
Full MacroXRF Capability, on a Lab Bench
The Atlas Veritas M is the compact, benchtop configuration of the Veritas macroXRF line. It is built for labs where floor space is limited but the analytical need is real: elemental mapping across samples larger than what a microXRF typically handles, without the footprint of a large-area floor system. The M sits at the intersection of accessibility and capability — a full macroXRF analytical platform in a format that fits on a lab bench.
Need maximum stage size and throughput for high sample volumes instead?
Bulk XRF, With the Spatial Picture Added
Veritas is more than a bulk XRF instrument. It adds 2D chemical mapping to reveal variations and anomalies that traditional bulk methods overlook entirely, and every claim below applies to the M exactly as it does to the X.
2D Mapping
Visualizes the spatial distribution of elements within a sample, not just an averaged composition.
Carbon Through Uranium
Comprehensive elemental coverage across a broad range of materials.
Large Area Analysis
Analyzes extensive sample areas with speed and precision, for both detailed and preliminary assessments.
High-Z Sensitivity
Exceptional sensitivity for detecting and quantifying heavier elements.
New Collimated Optics
Spot sizes ranging from 100 µm to 2 mm, tailored to the analytical requirement.
Automatic Focusing
State-of-the-art auto-focus — optimal results without manual adjustment.
Veritas Across Industrial Materials, Geology, and Conservation
Industrial Materials — Concrete & Steel
Element overlay maps of a concrete slab reveal chlorine, iron, calcium, and silicon distribution — directly relevant to durability and chloride-ingress assessment. In steel, Veritas identifies manganese segregation in Advanced High-Strength Steel slabs, mapping Fe, Mn, and V across the section.
Geochemistry — Cinnabar Hand Sample
An overlay map of a cinnabar rock hand sample, collected at 500 µm pixel size, showcases mercury, sulfur, iron, and silicon distribution — geochemical detail typically reserved for micro-focus instruments, captured here at macro scale and speed.
Conservation & Forensics — Currency Analysis
Thermal maps and an elemental overlay of a $50 bill from U.S. currency, mapping Fe, K, Cr, Zn, and Ti — demonstrating Veritas's fit for document and artifact examination, counterfeit detection, and conservation science on objects too large or too valuable to sample destructively.
Atlas Veritas MacroXRF vs. Atlas Apex MicroXRF
Choose Veritas M When…
Your sample is large, your priority is area coverage and throughput, and 100 µm to 2 mm resolution is sufficient. Bulk materials, large artifacts, gemstone trays, industrial slabs, and documents where scanning the whole object matters more than sub-10 µm detail, on a benchtop footprint.
Choose Atlas Apex When…
You need fine-feature resolution down to 5 µm. Mineral zoning, grain boundaries, individual particles, and micro-scale inclusions where the answer lives at a scale Veritas's optics aren't built to resolve.
See What Veritas Can Map in Your Application
Tell us about your sample size, elements of interest, and throughput requirements. We'll help determine whether Veritas M, Veritas X, or Atlas Apex is the right fit, and confirm current configuration options directly.
Designed and built in Austin, Texas, IXRF systems are backed by applications, engineering, training, and service support from the people who make them.
Frequently
Asked Questions
MacroXRF uses a larger X-ray beam to prioritize rapid, large-area elemental analysis and higher throughput, while MicroXRF uses a tightly focused beam for micron-scale spatial resolution. Atlas Veritas combines the speed and sensitivity of XRF with 2D elemental mapping, helping bridge conventional bulk XRF and high-resolution MicroXRF.
The Atlas Veritas M is a chamber-based MacroXRF system designed for automated analysis of laboratory samples and large sample arrays. The Atlas Veritas X extends the Veritas platform to larger and more unconventional samples, making it the better choice when sample size, weight, or geometry exceeds the practical limits of the M.
Atlas Veritas can detect elements from carbon through uranium, depending on detector configuration and analytical conditions. Its high-efficiency X-ray excitation is particularly well suited for rapid screening, large-area mapping, and sensitive analysis of medium- and high-atomic-number elements.
Atlas Veritas uses collimated X-ray optics with selectable spot sizes ranging from approximately 250 µm to 4 mm. This allows users to balance spatial resolution, X-ray intensity, sensitivity, and mapping speed according to the analytical objective.
Atlas Veritas can analyze a wide variety of materials, including geological specimens, metals, concrete, ceramics, industrial materials, gemstones, cultural heritage objects, and other heterogeneous samples. It is particularly useful when large-area chemistry or rapid elemental screening is more important than micron-scale spatial resolution.
There is no fixed number because capacity depends on the size and arrangement of the samples. Atlas Veritas M can automatically analyze large sample arrays within a single mapping workflow; IXRF has demonstrated the system analyzing 744 gemstones in one automated map.
Atlas Veritas M has a measurement chamber approximately 508 × 457 × 254 mm (20 × 18 × 10 in.) and can accommodate samples weighing up to approximately 7 kg, depending on sample geometry and positioning. Its automated mapping area is approximately 220 × 200 mm.
Yes. Atlas Veritas X is designed for applications where samples are too large, heavy, or irregularly shaped for a conventional chamber-based system. This expands MacroXRF analysis to larger geological specimens, industrial components, cultural heritage objects, and other samples that are difficult or undesirable to section.
Yes. XRF is a non-destructive elemental analysis technique, and many Atlas Veritas applications require little or no sample preparation. Clean and relatively flat surfaces can improve analytical consistency, but many samples can be analyzed intact without cutting, coating, or permanently altering them.
Yes. Atlas Veritas performs 2D elemental mapping to show how elements are spatially distributed across a sample, allowing users to identify compositional variations and anomalies that bulk XRF measurements can miss. The platform also supports quantitative elemental analysis for determining elemental concentrations when appropriate analytical methods and calibrations are used.
Atlas Veritas uses silicon drift detector (SDD) technology, with detector configurations available to balance sensitivity, spectral performance, and analytical throughput. Atlas Veritas M can be configured with up to two SDDs, with detector active areas selected according to the analytical requirements of the application.
Choose Atlas Veritas M when your samples fit within the chamber and you need fast, automated MacroXRF mapping, multi-sample analysis, or high-throughput screening. Choose Atlas Veritas X when sample size, weight, or geometry requires greater physical flexibility. An IXRF applications specialist can evaluate your samples and analytical goals to recommend the appropriate system and configuration.